Efficient nonlinear phenomena in integrated waveguides imply the realization in a nonlinear
material of tightly confining waveguides sustaining guided modes with a small effective area …

Downscaling, miniaturization and 3D staking of the micro/nano devices are burgeoning
phenomena in the semiconductor industry which have posed sophisticated challenges in …

In this paper, a three-dimensional atomic force microscope (3-D AFM) for imaging of the
micro-and nanoscale sidewall structures is presented. The system mainly consists of two …

Integrated photonics features applications in high-speed telecommunication, computing,
and sensing. These devices are ultimately limited by the optical loss occurring in the …

The charging on unconventional, rough, surface morphologies of polymeric substrates is
investigated. The case study is Ar plasma etching of PMMA surfaces with sinusoidal profiles …

We proposed a novel atomic force microscopy (AFM) technique based on the orthogonal
cantilever probe (OCP) for measuring the sidewall of microstructure/nanostructure. The OCP …

Multijunction solar cells must be electrically isolated from one to another at the end of the
fabrication process; a step known as mesa isolation. In this study, three different techniques …

With the growing importance of three-dimensional (3D) nanomaterials and devices, the use
of high-aspect-ratio (HAR) probes in atomic force microscopy (AFM) imaging enables full …

A critical dimensional (CD) probe, such as a boot shaped probe, is widely used for
measuring the sidewall profiles of nanostructures in atomic force microscopy (AFM) …

A novel atomic force microscope (AFM) dual-probe caliper for critical dimension (CD)
metrology has been developed. The caliper is equipped with two facing tilted optical fiber …