FinFET to GAA MBCFET: A Review and Insights

RR Das, TR Rajalekshmi, A James - IEEE Access, 2024 - ieeexplore.ieee.org
This review article presents a journey from Fin-shaped field effect transistor (FinFET) to gate-
all-around multi-bridge channel field effect transistor (GAA MBCFET) technology, unraveling …

Performance analysis and optimization of under-gate dielectric modulated Junctionless FinFET biosensor

HD Sehgal, Y Pratap, M Gupta… - IEEE Sensors Journal, 2021 - ieeexplore.ieee.org
In this work Junctionless (JL) FinFET is designed to operate as an Under Gate (UG)
Dielectric Modulated (DM) biosensor for the detection of various biomolecules-Streptavidin …

Performance Investigation of Novel Pt/Pd-SiO2 Junctionless FinFET as a High Sensitive Hydrogen Gas Sensor for Industrial Applications

HD Sehgal, Y Pratap, M Gupta… - IEEE Sensors Journal, 2021 - ieeexplore.ieee.org
In this paper, a junctionless (JL) Silicon FinFET (Fin Field effect transistor) has been
designed as a hydrogen gas (H 2) sensor. An analytical model has been developed to …

Analytical performance of the threshold voltage and subthreshold swing of CSDG MOSFET

UA Maduagwu, VM Srivastava - Journal of Low Power Electronics and …, 2019 - mdpi.com
In this research work, the threshold voltage and subthreshold swing of cylindrical
surrounding double-gate (CSDG) MOSFET have been analyzed. These analyses are based …

Subthreshold model of asymmetric GAA junctionless FETs with scaled equivalent oxide thickness

A Kumar, PK Tiwari, JN Roy - Microelectronics Journal, 2022 - Elsevier
A comprehensive subthreshold model of asymmetric gate all around (GAA) junctionless (JL)
FETs with scaled equivalent oxide thickness is developed in the work. The perimeter …

[PDF][PDF] Effects of high-k dielectric materials on electrical characteristics of DG n-FinFETs

NE Boukortt, B Hadri, S Batane - international journal of computer …, 2016 - researchgate.net
This paper investigates the electrical characteristics of the nanoscale n-channel double gate
fin field-effect transistor (FinFET) structures and their sensitivity to gate dielectric materials …

RF/Analog performance of GaAs Multi-Fin FinFET with stress effect

RR Das, S Maity, A Chowdhury, A Chakraborty - Microelectronics Journal, 2021 - Elsevier
Abstract Multiple Fins structured FinFET (M-FinFET) is a promising semiconductor device for
future advancement of CMOS technology. In this paper, a new GaAs based M-FinFET …

Reliability Assessment of GaAs/Al₂O₃ Junctionless FinFET in the Presence of Interfacial Layer Defects and Radiations

N Garg, Y Pratap, M Gupta… - IEEE Transactions on …, 2020 - ieeexplore.ieee.org
This research work reports reliability assessment of junctionless (JL) FinFET in the presence
of interfacial trap charges and radiations. The degradation in performance of JL FinFET is …

Proposal for variability-induced effective radius of elliptical gate-all-around junctionless transistors and its applicability in hydrogen gas sensors

P Sharma, S Kumar, P Kumar - AEU-International Journal of Electronics …, 2024 - Elsevier
Nano-ribbons with gate-all-around (GAA) architecture have been predicted to serve as next-
generation on-chip transistors, among which, the junctionless transistor (JLT) has emerged …

Gaussian doping profile in the channel region: A technology booster for junctionless transistors

P Sharma, S Kumar - AEU-International Journal of Electronics and …, 2023 - Elsevier
In this work, we have developed analytical models for the channel potential, threshold
voltage and drain current for a cylindrical Gate-All-Around Junctionless Metal-Oxide …