Fast scanning probe microscopy via machine learning: non‐rectangular scans with compressed sensing and gaussian process optimization

KP Kelley, M Ziatdinov, L Collins, MA Susner… - Small, 2020 - Wiley Online Library
Fast scanning probe microscopy enabled via machine learning allows for a broad range of
nanoscale, temporally resolved physics to be uncovered. However, such examples for …

High-speed mapping of surface charge dynamics using sparse scanning Kelvin probe force microscopy

M Checa, AS Fuhr, C Sun, R Vasudevan… - Nature …, 2023 - nature.com
Unraveling local dynamic charge processes is vital for progress in diverse fields, from
microelectronics to energy storage. This relies on the ability to map charge carrier motion …

Generative model-driven sampling strategy for the high-efficiency measurement of complex surfaces on coordinate measuring machines

J Ren, M Ren, L Sun, L Zhu… - IEEE Transactions on …, 2021 - ieeexplore.ieee.org
Coordinate measuring machines are widely used in the precision measurement of
manufacturing workpieces. However, the nature of a point-by-point probing characteristic …

Automated piezoresponse force microscopy domain tracking during fast thermally stimulated phase transition in CuInP2S6

M Checa, KP Kelley, R Vasudevan, L Collins… - …, 2023 - iopscience.iop.org
Real-time tracking of dynamic nanoscale processes such as phase transitions by scanning
probe microscopy is a challenging task, typically requiring extensive and laborious human …

Assessment of subsampling schemes for compressive nano-FTIR imaging

S Metzner, B Kästner, M Marschall… - IEEE Transactions …, 2022 - ieeexplore.ieee.org
Nano-Fourier transform infrared (FTIR) imaging is a powerful scanning-based technique at
nanometer spatial resolution that combines FTIR spectroscopy and scattering-type scanning …

Multi-level deep domain adaptive adversarial model based on tensor-train decomposition for industrial time series forecasting

C Yang, C Peng, L Chen, K Hao - Measurement Science and …, 2023 - iopscience.iop.org
The polyester industry is a complex process industry, building a time series prediction model
for new production lines or equipment with new sensors can be challenging due to a lack of …

Fast surface topography reconstruction method for profilometer measurement based on neural continuous representation

J Ren, M Ren - … Conference on Sensing, Measurement & Data …, 2021 - ieeexplore.ieee.org
Surface profilometers are indispensable for the measurements on precise machining and
optical manufacturing industries. However, to acquire accurate surface topography, existing …

Feature correlation method for image reconstruction evaluation in under-sampled scanning probe microscopy

K Ueda, Z Diao, L Hou, H Yamashita… - Japanese Journal of …, 2024 - iopscience.iop.org
We introduce an advanced feature-correlation approach for evaluating the accuracy of data
completion in scanning probe microscopy (SPM). Our method utilizes characteristic patterns …

Time-reduction imaging method for scanning-probe microscopy using a compressed sensing algorithm based on sequential reconstruction method

K Ueda, D Zhuo, L Hou, H Yamashita… - Journal of the Ceramic …, 2023 - jstage.jst.go.jp
Measurement of atoms and molecules on surfaces is very important in the development of
nanodevices and nanomaterials. Scanning probe microscopy (SPM) is a powerful method …

Reconstruction of multi-frame semi-sparse scanning probe microscopy images using dependent Gaussian process

W Zhou, M Ren, L Zhu - Measurement Science and Technology, 2020 - iopscience.iop.org
A major drawback of scanning probe microscopes (SPMs) is the time-consuming image
acquisition, typically on the order of tens of seconds to minutes. Sparse raster scanning and …