Zernike polynomials and their applications

K Niu, C Tian - Journal of Optics, 2022 - iopscience.iop.org
The Zernike polynomials are a complete set of continuous functions orthogonal over a unit
circle. Since first developed by Zernike in 1934, they have been in widespread use in many …

Assessment of optical systems by means of point-spread functions

JJM Braat, S van Haver, AJEM Janssen, P Dirksen - Progress in optics, 2008 - Elsevier
Publisher Summary This chapter presents the computation of the point-spread function of
optical imaging systems and the characterization of these systems by means of the …

Extended Nijboer–Zernike approach for the computation of optical point-spread functions

AJEM Janssen - JOSA A, 2002 - opg.optica.org
New Bessel-series representations for the calculation of the diffraction integral are
presented yielding the point-spread function of the optical system, as occurs in the Nijboer …

Complete polarization and phase control for focus-shaping in high-NA microscopy

F Kenny, D Lara, OG Rodríguez-Herrera, C Dainty - Optics express, 2012 - opg.optica.org
We show that, in order to attain complete polarization control across a beam, two spatially
resolved variable retardations need to be introduced to the light beam. The orientation of the …

Modal-based phase retrieval for adaptive optics

J Antonello, M Verhaegen - JOSA A, 2015 - opg.optica.org
We consider using phase retrieval (PR) to correct phase aberrations in an optical system.
Three measurements of the point-spread function (PSF) are collected to estimate an …

Extended Nijboer–Zernike representation of the vector field in the focal region of an aberrated high-aperture optical system

JJM Braat, P Dirksen, AJEM Janssen, AS van de Nes - JOSA A, 2003 - opg.optica.org
Taking the classical Ignatowsky/Richards and Wolf formulas as our starting point, we present
expressions for the electric field components in the focal region in the case of a high …

The microscope in a computer: image synthesis from three-dimensional full-vector solutions of Maxwell's equations at the nanometer scale

İR Çapoğlu, JD Rogers, A Taflove, V Backman - Progress in Optics, 2012 - Elsevier
We present a comprehensive review and tutorial on emerging numerical electromagnetic
simulations of optical imaging systems based upon three-dimensional full-vector solutions of …

High NA EUV scanner: obscuration and wavefront description

L de Winter, T Tudorovskiy… - Extreme Ultraviolet …, 2020 - spiedigitallibrary.org
The high NA= 0.55 EUV scanner has an obscuration in the pupil. This has led to the choice
to expand the aberration wave-front not in Zernikes anymore, but in other, orthogonal, basis …

Aberration retrieval using the extended Nijboer-Zernike approach

P Dirksen, J Braat, AJEM Janssen… - Journal of Micro …, 2003 - spiedigitallibrary.org
We give the proof of principle of a new experimental method to determine the aberrations of
an optical system in the field. The measurement is based on the observation of the intensity …

Zernike vs. Bessel circular functions in visual optics

JP Trevino, JE Gómez‐Correa… - Ophthalmic and …, 2013 - Wiley Online Library
Purpose We propose the B essel C ircular F unctions as alternatives of the Z ernike C ircle P
olynomials to represent relevant circular ophthalmic surfaces. Methods We assess the fitting …