Refurbished chips (ie, chips re-used legally in circular economy) and counterfeited chips (ie,
used chips fraudulently sold as new) are a growing concern for the industry because of their …

On-chip degradation monitors have recently gained significant relevance because they can
provide real-time estimations of IC reliability by exploiting the fundamental physics of BTI …

This paper presents an innovative and automated measurement setup for the
characterization of variability effects in CMOS transistors using array-based integrated …

This work reports an on-chip heater structure fabricated in the Front End of Line (FEOL) on a
versatile ring-oscillator (RO) array utilized to conduct statistical characterization of on-chip …

This article presents a new methodology to extract, at a given operation condition, the
statistical distribution of the number of active defects that contribute to the observed device …

This article reports a test chip design in commercial 40-nm process technology to
characterize the level of time-based degradation in metal-oxide-semiconductor field-effect …

Abstract Random Telegraph Noise (RTN) has attracted increasing interest in the last years.
This phenomenon introduces variability in the electrical properties of transistors, in particular …

In the past few years, Time-Dependent Variability has become a subject of growing concern
in CMOS technologies. In particular, phenomena such as Bias Temperature Instability, Hot …

As well known, the implementation of high-κ dielectrics (eg, HfO_2) in nanoscale devices is
unavoidable to cope with the device scaling required by the market. Nevertheless, due to the …

In this work, the challenge of the I/O development roadmap is discussed. Utilizing design
and technology co-optimization (DTCO), a cost-effective circuit solution of a 1.8-V general …