Scanning transmission electron microscopy (STEM) has emerged as a uniquely powerful
tool for structural and functional imaging of materials on the atomic level. Driven by …

In the last few years, electron microscopy has experienced a new methodological paradigm
aimed to fix the bottlenecks and overcome the challenges of its analytical workflow. Machine …

We review the growing use of machine learning in electron microscopy (EM) driven in part
by the availability of fast detectors operating at kiloHertz frame rates leading to large data …

The component of orbital angular momentum (OAM) in the propagation direction is one of
the fundamental quantities of an electron wave function that describes its rotational …

Transmission electron microscopy can be described in terms of the measurement, in an
appropriate quantum basis, of the quantum state of an electron after scattering through a …

The key to optimizing spatial resolution in a state-of-the-art scanning transmission electron
microscope is the ability to measure and correct for electron optical aberrations of the probe …

The performance of image classification technology based on deep network has been
greatly improved, making computer vision enter the stage of industrialization and be …

We report on the automatic alignment of a transmission electron microscope equipped with
an orbital angular momentum sorter using a convolutional neural network. The neural …

New developments in TEM instrumentation and methodology have improved quantitative
and high-throughput analysis together with sub-Angstrom spatial resolution, meV energy …

The observation of beam sensitive materials is a challenging field that benefits from the use
of low electron doses and fast acquisition, to obtain as much information as possible before …