Electron tunneling through atomically flat and ultrathin hexagonal boron nitride (h-BN) on
gold-coated mica was investigated using conductive atomic force microscopy. Low-bias …

In this review, we will discuss recent progress in metal oxide charge transport layers in
perovskite solar cells (PSCs). While a large number of PSCs have at least one metal oxide …

The first book to summarize the applications of CAFM as the most important method in the
study of electronic properties of materials and devices at the nanoscale. To provide a global …

Atomic force microscopy (AFM) and scanning tunneling microscopy (STM) are well
established techniques to image surfaces and to probe material properties at the atomic and …

Atomic force microscopy (AFM) is a key tool for nanotechnology research and finds its
principal application in the determination of surface topography. However, the use of the …

Multiple studies have reported the observation of electro‐synaptic response in different
metal/insulator/metal devices. However, most of them analyzed large (> 1 µm2) devices that …

We investigate the role of grains and grain boundaries (GBs) in the electron transport
through poly-crystalline HfO 2 by means of conductive atomic force microscopy (CAFM) …

The influence of the probe tip type on the electrical oxide thickness result was researched for
four differently coated conductive tip types using SiO2 (oxide) films with optical thickness of …

We have investigated the tunneling transport of mono-and few-layers of MnPS 3 by using
conductive atomic force microscopy. Due to the band alignment of indium tin oxide/MnPS …

The tunneling current through an atomic force microscopy (AFM) tip is used to evaluate the
effective electrical contact area, which exists between tip and sample in contact-AFM …