Nanoelectronics is changing the way the world communicates, and is transforming our daily
lives. Continuing Moore's law and miniaturization of low-power semiconductor chips with …

Pulsed infrared thermography (PIRT) is a very fast and non-destructive technique for testing
various types of specimens. This makes PIRT interesting for 100%-inspections in industrial …

In a highly competitive and demanding micro-electronics market, non-destructive testing
(NDT) technology has been widely applied to defect detection and evaluation of micro …

In this work, a concept for the detection of defects in the solder layer between a power
semiconductor and the printed circuit board (PCB) is proposed. Four temperature sensors in …

Provides in-depth knowledge on novel materials that make electronics work under high-
temperature and high-pressure conditions This book reviews the state of the art in research …

In this study we demonstrate the capabilities of pulsed infrared thermography (PIRT) for the
inspection of sintered and soldered chip interconnections. Furthermore, this work will …

This research focuses on the application of lock-in thermography (LIT) for inspecting
sintered chip interconnections, which are commonly used in electronic components. By …

A technique incorporating the statistical methods into colour range scale of a 2D elemental
image was developed to enable visual evaluation of significant differences in the data-a …

X-ray imaging provides direct visualization of sample's internal structures and defects.
Operation principles of two-dimensional X-ray and three-dimensional X-ray computer …

Solder connections provide an electrical and mechanical connection between components
and PCB (Printed Circuit Board) in electronic devices. It is very important to develop a …