Configuring plural cores to perform an instruction having a multi-core characteristic

LB Capps Jr, MJ Shapiro, RH Bell, TE Cook… - US Patent …, 2013 - Google Patents
(57) ABSTRACT A processor having multiple cores coordinates functions per formed on the
cores to automatically, dynamically and repeat edly reconfigure the cores for optimal …

Exploiting process variation in a multicore processor

A Biswas, MD Powell - US Patent 9,442,559, 2016 - Google Patents
A disclosed method includes accessing characterization data indicating first and second
sets of performance characteristics for first and second processing cores of a processor; …

Systems, methods and devices for determining work placement on processor cores

GM Therien, MD Powell, V Ramani, A Biswas… - US Patent …, 2018 - Google Patents
Apparatuses, methods and storage medium for computing including determination of work
placement on processor cores are disclosed herein. In embodiments, an apparatus may …

Uniform power density across processor cores at burn-in

LB Capps Jr, A Haridass, RE Newhart… - US Patent …, 2008 - Google Patents
(57) ABSTRACT A computer implemented method, data processing system, and computer
usable code are provided for burn-in testing of a multiprocessor. A process identifies a …

Multiple-Core Processor

LB Capps, RE Newhart, MJ Shapiro - US Patent App. 11/469,550, 2008 - Google Patents
US20080126748A1 - Multiple-Core Processor - Google Patents US20080126748A1 -
Multiple-Core Processor - Google Patents Multiple-Core Processor Download PDF Info …

Three-dimensional (3D) stacked integrated circuit testing

CY Cher, E Kursun, GW Maier… - US Patent 8,542,030, 2013 - Google Patents
BACKGROUND This invention relates generally to integrated circuits, and more particularly
to heterogeneous stacked integrated circuit testing. Computer chips and integrated chip …

Systems, methods and devices for determining work placement on processor cores

GM Therien, MD Powell, V Ramani, A Biswas… - US Patent …, 2021 - Google Patents
Apparatuses, methods and storage medium for computing including determination of work
placement on processor cores are disclosed herein. In embodiments, an apparatus may …

Burn-in method for surface emitting semiconductor laser device

S Omori - US Patent 8,624,614, 2014 - Google Patents
A burn-in method includes applying a stress current for applying thermal stress to a surface-
emitting semiconductor laser, measuring an operation characteristic of the surface-emitting …

Systems, methods and devices for determining work placement on processor cores

GM Therien, MD Powell, V Ramani, A Biswas… - US Patent …, 2022 - Google Patents
Apparatuses, methods and storage medium for computing including determination of work
placement on processor cores are disclosed herein. In embodiments, an apparatus may …

Uniform power density across processor cores at burn-in

LB Capps Jr, A Haridass, RE Newhart… - US Patent …, 2011 - Google Patents
The present application relates generally to testing elec tronic circuits. More specifically, the
present application relates to a computer implemented method, apparatus, and computer …