In this article, authors explore radiation hardening techniques through the design of a test
chip implemented in 16-nm FinFET technology, along with architectural and redundancy …

In order for modern security implementations to be trusted, they need to be successfully
evaluated against hardware fault attacks. Lasers are excellent means of introducing either …

By decreasing transistors feature size in nanoscale technology, the effect of soft error on
combinational circuits has become a challenging problem as the particle strikes may lead to …

Laser attacks are an effective threat against secure integrated circuits, due to their capability
to inject very precise hardware faults. Evaluating the effect of such attacks from RTL …

As technology continuously shrinks, radiation-induced soft errors have become a great
threat to the circuit reliability. Among all the causes, the Single-Event Transient (SET) effect …

Pulse width of single event transient can be shrunk by pulse quenching effect in
combinational circuits. And it is found that the pulse quenching effect is closely related to the …

State-of-the-art commercial placement tools have as goals to optimize area, timing, and
power. Over the years, several reliability oriented placement strategies have been proposed …

Abstract Design of modern integrated circuits increasingly requires consideration of
radiation effects, especially in space and other high-risk environments. With fabrication …

The effects of soft error in combinational logics are challenged by decreasing the feature
size of transistors in nanoscale technologies. Moreover, the single event transients (SETs) …

Nowadays nanoscale combinational circuits are facing significant reliability challenges
including soft errors and process variations. This paper presents novel process variation …