A review of Raman thermography for electronic and opto-electronic device measurement with submicron spatial and nanosecond temporal resolution

M Kuball, JW Pomeroy - IEEE Transactions on Device and …, 2016 - ieeexplore.ieee.org
We review the Raman thermography technique, which has been developed to determine the
temperature in and around the active area of semiconductor devices with submicron spatial …

Mechanisms and fast kinetics of the catastrophic optical damage (COD) in GaAs‐based diode lasers

JW Tomm, M Ziegler, M Hempel… - Laser & Photonics …, 2011 - Wiley Online Library
COD diagram determined for a batch of broad‐area AlGaAs diode lasers. The time to COD
within a single current pulse is plotted versus the actual average optical power in the …

Thermoreflectance spectroscopy—Analysis of thermal processes in semiconductor lasers

D Pierścińska - Journal of Physics D: Applied Physics, 2017 - iopscience.iop.org
This review focuses on theoretical foundations, experimental implementation and an
overview of experimental results of the thermoreflectance spectroscopy as a powerful …

Investigation of thermal properties of mid-infrared AlGaAs/GaAs quantum cascade lasers

K Pierściński, D Pierścińska, M Iwińska… - Journal of Applied …, 2012 - pubs.aip.org
We report on detailed experimental investigation of thermal properties of AlGaAs/GaAs
quantum cascade lasers (QCLs) emitting at wavelength of 9.4 μm. Different mounting …

@ articleInfo {10090302, title=" High resolution interface circuit for closed-loop accelerometer", journal=" Journal of Semiconductors", volume=" 32", number=" 4"

Y Liang, L Xiaowei, C Weiping, Z Zhiping - Journal of Semiconductors, 2011 - jos.ac.cn
author=" Yin Liang"," Liu Xiaowei"," Chen Weiping"," Zhou Zhiping", keywords=" closed-loop
accelerometer"," interface circuit"," switched capacitor"," low noise", abstract=" This paper …

Catastrophic optical mirror damage in diode lasers monitored during single-pulse operation

M Ziegler, JW Tomm, D Reeber, T Elsaesser… - Applied Physics …, 2009 - pubs.aip.org
Catastrophic optical mirror damage (COMD) is analyzed for 808 nm emitting diode lasers in
single-pulse operation in order to separate facet degradation from subsequent degradation …

CCD thermoreflectance spectroscopy as a tool for thermal characterization of quantum cascade lasers

D Pierścińska, K Pierściński, M Morawiec… - Semiconductor …, 2016 - iopscience.iop.org
The development of charge coupled device thermoreflectance (CCD TR) instrumentation for
accurate and rapid evaluation of the thermal characteristics of quantum cascade lasers is …

[HTML][HTML] Output facet heating mechanism for uncoated high power long wave infrared quantum cascade lasers

D Hathaway, M Shahzad, TS Sakthivel, M Suttinger… - AIP Advances, 2020 - pubs.aip.org
Output facet temperatures of an uncoated high power continuous-wave quantum cascade
laser (QCL) emitting at 8.5 μm were measured by using micro-Raman thermometry. The rate …

Chip-carrier thermal barrier and its impact on lateral thermal lens profile and beam parameter product in high power broad area lasers

J Rieprich, M Winterfeldt, R Kernke, JW Tomm… - Journal of Applied …, 2018 - pubs.aip.org
High power broad area diode lasers with high optical power density in a small focus spot are
in strong commercial demand. For this purpose, the beam quality, quantified via the beam …

Heat dissipation schemes in AlInAs/InGaAs/InP quantum cascade lasers monitored by CCD thermoreflectance

D Pierścińska, K Pierściński, P Gutowski, M Badura… - Photonics, 2017 - mdpi.com
In this paper, we report on the experimental investigation of the thermal performance of
lattice matched AlInAs/InGaAs/InP quantum cascade lasers. Investigated designs include …