Performance failure due to aging is an increasing concern for RF circuits. While most aging
studies are focused on the concept of mean-time-to-failure, for analog circuits, aging results …

Failure due to aging mechanisms is an important concern for RF circuits. In-field aging
results in continuous degradation of circuit performances before they cause catastrophic …

Counterfeit ICs have become an issue for semiconductor manufacturers due to impacts on
their reputation and lost revenue. Counterfeit ICs are either products that are intentionally …

This thesis presents the outcome of investigations on the effects of aging induced parameter
shifts and performance degradation in analog and mixed signal circuits fabricated in deep …

In this paper, an RF low noise amplifier (LNA) with self-recovery capability has been
designed and implemented. A degradation model of hot carrier injection (HCI) of n-channel …

The design for reliability concept is already in use on digital circuits, but not systematically in
use on AMS or RF circuits. A reliable circuit design demands knowledge of the physical …

Failure due to aging mechanisms is an important concern for RF circuits. In-field aging
results in continuous degradation of circuit performances before they cause catastrophic …

Circuit ageing degradation is becoming worse in advanced node technologies, where low
power and low cost RF front-end should be implemented. Thus, reliability is one of the most …

Circuit ageing degradation is becoming worse in advanced technologies, while application
fields like military, medical and energy demand more reliability. Thus, reliability is one of the …

In this work, we have been motivated to innovate in RF front-end design. New analysis and
synthesis methodologies have been proposed including the variability and the ageing …