Probe construction using a recess

R Gleason, MA Bayne, K Smith, T Lesher… - US Patent …, 2005 - Google Patents
(57) ABSTRACT A method of constructing a probe which includes providing a Substrate and
creating a first Substantially asymmetrical receSS within the Substrate. A conductive material …

Fully adjustable integrated exercise workstation

C Leonhard - US Patent 8,485,945, 2013 - Google Patents
BACKGROUND Automation and technological convenience have trans formed previously
active and ambulatory persons across the globe into increasingly sedentary beings. This …

Membrane probing system

R Gleason, MA Bayne, K Smith, T Lesher… - US Patent …, 2004 - Google Patents
A substrate, preferably constructed of a ductile material and a tool having the desired shape
of the resulting device for contacting contact pads on a test device is brought into contact …

Differential waveguide probe

RL Campbell, M Andrews - US Patent 7,876,114, 2011 - Google Patents
US7876114B2 - Differential waveguide probe - Google Patents US7876114B2 - Differential
waveguide probe - Google Patents Differential waveguide probe Download PDF Info …

Method for probing an electrical device having a layer of oxide thereon

R Gleason, MA Bayne, K Smith, T Lesher… - US Patent …, 2004 - Google Patents
US6708386B2 - Method for probing an electrical device having a layer of oxide thereon -
Google Patents US6708386B2 - Method for probing an electrical device having a layer of …

Membrane probing system

PA Tervo, KR Smith, CE Cowan… - US Patent …, 2005 - Google Patents
(57) ABSTRACT A membrane probing assembly includes a probe card with conductorS
Supported thereon, wherein the conductors include at least a Signal conductor located …

Fuel injection burner

G Tackels, P Rouchy, J Vernaz - US Patent 6,244,524, 2001 - Google Patents
In a combustion process, especially one used for melting glass, the delivery of fuel is
ensured by an apparatus having at least one burner (5) which is equipped with at least one …

Probe for testing a device under test

KR Gleason, T Lesher, EW Strid, M Andrews… - US Patent …, 2004 - Google Patents
US6815963B2 - Probe for testing a device under test - Google Patents US6815963B2 -
Probe for testing a device under test - Google Patents Probe for testing a device under test …

Active wafer probe

E Strid, KR Gleason - US Patent 7,427,868, 2008 - Google Patents
(57) ABSTRACT A probe suitable for probing a semiconductor wafer that includes an active
circuit. The probe may have a rigid probing member and include a flexible interconnection …

System for testing semiconductors

P Andrews, D Hess - US Patent 7,656,172, 2010 - Google Patents
US7656172B2 - System for testing semiconductors - Google Patents US7656172B2 -
System for testing semiconductors - Google Patents System for testing semiconductors …