The role of flaw geometry in thin film delamination from two-dimensional interface flaws along free edges
JM Ambrico, MR Begley - Engineering fracture mechanics, 2003 - Elsevier
Delamination from planar interface edge flaws between a thin film and a semi-infinite
substrate is examined to determine the roles of flaw width and depth relative to the film …
substrate is examined to determine the roles of flaw width and depth relative to the film …
[图书][B] Fracture on thin layer systems with realistic feature geometry
JM Ambrico - 2001 - search.proquest.com
Thin films are commonly employed in many applications, varying from thermal barrier
coatings to microprocessor computer chips. Reliability is an important issue in such …
coatings to microprocessor computer chips. Reliability is an important issue in such …