Giant amplification of spin dependent recombination at heterojunctions through a gate controlled bipolar effect

T Aichinger, PM Lenahan - Applied Physics Letters, 2012 - pubs.aip.org
We demonstrate a method for spin dependent recombination (SDR) in metal-oxide-
semiconductor-field-effect-transistors which (i) greatly amplifies the spin dependent fraction …

Zero-field detection of spin dependent recombination with direct observation of electron nuclear hyperfine interactions in the absence of an oscillating electromagnetic …

CJ Cochrane, PM Lenahan - Journal of Applied Physics, 2012 - pubs.aip.org
Electrically detected magnetic resonance (EDMR) involves the electron paramagnetic
resonance (EPR) study of spin dependent transport mechanisms such as spin dependent …

Defect chemistry and electronic transport in low-κ dielectrics studied with electrically detected magnetic resonance

MJ Mutch, PM Lenahan, SW King - Journal of Applied Physics, 2016 - pubs.aip.org
Defect mediated electronic transport phenomena in low-κ dielectric films are of great
technological interest for state-of-the-art and next generation microprocessors. At the …

[HTML][HTML] Observation of electrically detected electron nuclear double resonance in amorphous hydrogenated silicon films

BR Manning, JP Ashton, PM Lenahan - Applied Physics Letters, 2021 - pubs.aip.org
We report on the electrical detection of electron nuclear double resonance (EDENDOR)
through spin-dependent tunneling transport in an amorphous hydrogenated silicon thin film …

Recombination centers in 4H-SiC investigated by electrically detected magnetic resonance and ab initio modeling

J Cottom, G Gruber, P Hadley, M Koch… - Journal of Applied …, 2016 - pubs.aip.org
Electrically detected magnetic resonance (EDMR) is a powerful technique for the
observation and categorization of paramagnetic defects within semiconductors. The …

A nitrogen-related deep level defect in ion implanted 4H-SiC pn junctions—A spin dependent recombination study

T Aichinger, PM Lenahan, BR Tuttle… - Applied Physics Letters, 2012 - pubs.aip.org
Nitrogen implantation creates a high density of recombination centers in SiC which can
degrade the performance of ion implanted pn junctions. We use spin dependent …

Defects and electronic transport in hydrogenated amorphous SiC films of interest for low dielectric constant back end of the line dielectric systems

TA Pomorski, BC Bittel, CJ Cochrane… - Journal of Applied …, 2013 - pubs.aip.org
Back end of line dielectrics with low dielectric constants are needed for current and future
integrated circuit technology. However, an understanding of the defects that cause leakage …

[HTML][HTML] Slow-and rapid-scan frequency-swept electrically detected magnetic resonance of MOSFETs with a non-resonant microwave probe within a semiconductor …

DJ McCrory, MA Anders, JT Ryan… - Review of Scientific …, 2019 - pubs.aip.org
We report on a novel electron paramagnetic resonance (EPR) technique that merges
electrically detected magnetic resonance (EDMR) with a conventional semiconductor wafer …

[HTML][HTML] Apparatus for electrically detected electron nuclear double resonance in solid state electronic devices

BR Manning, RJ Waskiewicz, DJ McCrory… - Review of Scientific …, 2019 - pubs.aip.org
BACKGROUND In EPR measurements, one observes the response of paramagnetic centers
to a large magnetic field in combination with an oscillating magnetic field. The magnetic field …

[HTML][HTML] Electrically detected electron nuclear double resonance in 4H-SiC bipolar junction transistors

RJ Waskiewicz, BR Manning, DJ McCrory… - Journal of Applied …, 2019 - pubs.aip.org
We demonstrate high signal-to-noise electrically detected electron-nuclear double
resonance measurements on fully processed bipolar junction transistors at room …