Fault diagnosis of electronic systems using intelligent techniques: A review

WG Fenton, TM McGinnity… - IEEE Transactions on …, 2001 - ieeexplore.ieee.org
In an increasingly competitive marketplace system complexity continues to grow, but time-to-
market and lifecycle are reducing. The purpose of fault diagnosis is the isolation of faults on …

A survey on fault diagnosis of analog circuits: Taxonomy and state of the art

D Binu, BS Kariyappa - AEU-International Journal of Electronics and …, 2017 - Elsevier
Due to the wide range of applications of electronic circuits in the recent years, the fault
diagnosis in electronic circuits is a foremost problem. The main purpose of the fault …

A Formal Analysis of Fault Diagnosis with D-matrices

JW Sheppard, SGW Butcher - Journal of Electronic Testing, 2007 - Springer
As new approaches and algorithms are developed for system diagnosis, it is important to
reflect on existing approaches to determine their strengths and weaknesses. Of concern is …

[PDF][PDF] 装备测试性建模与设计技术

邱静, 刘冠军, 杨鹏, 吕克洪, 苏永定, 陈希祥 - 2012 - ecsponline.com
测试性是装备便于测试和诊断的重要设计特性, 它已成为和可靠性, 维修性同等重要的独立学科,
开展测试性设计技术研究具有重要的学术价值和工程指导意义. 本书针对测试性建模与设计问题 …

[图书][B] Zuverlässigkeit von Geräten und Systemen

A Birolini - 2013 - books.google.com
Dieses Buch gibt eine fundierte Einführung in die Methoden der Qualitäts-und
Zuverlässigkeitssicherung bei der Entwicklung und Produktion von Geräten und Systemen …

A Bayesian approach to diagnosis and prognosis using built-in test

JW Sheppard, MA Kaufman - IEEE Transactions on …, 2005 - ieeexplore.ieee.org
Accounting for the effects of test uncertainty is a significant problem in test and diagnosis,
especially within the context of built-in test. Of interest here, how does one assess the level …

Role of BIT in support system maintenance and availability

R Drees, N Young - IEEE Aerospace and Electronic Systems …, 2004 - ieeexplore.ieee.org
The role of built in test (BIT) in electronic systems has grown in prominence with the
advances in system complexity and concern over maintenance lifecycle costs of large …

Exclusive test and its applications to fault diagnosis

VD Agrawal, DH Baik, YC Kim… - … Conference on VLSI …, 2003 - ieeexplore.ieee.org
We introduce a new type of test, called exclusive test, and discuss its application to fault
diagnosis in combinational circuits. A test that detects exactly one fault from a given pair of …

[引用][C] 基于混合二进制粒子群-遗传算法的测试优化选择研究

陈希祥, 邱静, 刘冠军 - 仪器仪表学报, 2009

[引用][C] 测试不可靠条件下的诊断策略优化方法

杨鹏, 邱静, 刘冠军 - 仪器仪表学报, 2008