D Binu, BS Kariyappa - AEU-International Journal of Electronics and …, 2017 - Elsevier
Due to the wide range of applications of electronic circuits in the recent years, the fault diagnosis in electronic circuits is a foremost problem. The main purpose of the fault …
As new approaches and algorithms are developed for system diagnosis, it is important to reflect on existing approaches to determine their strengths and weaknesses. Of concern is …
Dieses Buch gibt eine fundierte Einführung in die Methoden der Qualitäts-und Zuverlässigkeitssicherung bei der Entwicklung und Produktion von Geräten und Systemen …
JW Sheppard, MA Kaufman - IEEE Transactions on …, 2005 - ieeexplore.ieee.org
Accounting for the effects of test uncertainty is a significant problem in test and diagnosis, especially within the context of built-in test. Of interest here, how does one assess the level …
R Drees, N Young - IEEE Aerospace and Electronic Systems …, 2004 - ieeexplore.ieee.org
The role of built in test (BIT) in electronic systems has grown in prominence with the advances in system complexity and concern over maintenance lifecycle costs of large …
We introduce a new type of test, called exclusive test, and discuss its application to fault diagnosis in combinational circuits. A test that detects exactly one fault from a given pair of …