Evolution from lead‐based to lead‐free piezoelectrics: engineering of lattices, domains, boundaries, and defects leading to giant response

M Waqar, H Wu, J Chen, K Yao, J Wang - Advanced Materials, 2022 - Wiley Online Library
Piezoelectric materials are known to mankind for more than a century, with numerous
advancements made in both scientific understandings and practical applications. In the last …

Imaging beam‐sensitive materials by electron microscopy

Q Chen, C Dwyer, G Sheng, C Zhu, X Li… - Advanced …, 2020 - Wiley Online Library
Electron microscopy allows the extraction of multidimensional spatiotemporally correlated
structural information of diverse materials down to atomic resolution, which is essential for …

Four-dimensional scanning transmission electron microscopy (4D-STEM): From scanning nanodiffraction to ptychography and beyond

C Ophus - Microscopy and Microanalysis, 2019 - cambridge.org
Scanning transmission electron microscopy (STEM) is widely used for imaging, diffraction,
and spectroscopy of materials down to atomic resolution. Recent advances in detector …

Strain fields in twisted bilayer graphene

NP Kazmierczak, M Van Winkle, C Ophus… - Nature materials, 2021 - nature.com
Van der Waals heteroepitaxy allows deterministic control over lattice mismatch or azimuthal
orientation between atomic layers to produce long-wavelength superlattices. The resulting …

Automated experiment in 4D-STEM: exploring emergent physics and structural behaviors

KM Roccapriore, O Dyck, MP Oxley, M Ziatdinov… - ACS …, 2022 - ACS Publications
Automated experiments in 4D scanning transmission electron microscopy (STEM) are
implemented for rapid discovery of local structures, symmetry-breaking distortions, and …

[HTML][HTML] Detectors—The ongoing revolution in scanning transmission electron microscopy and why this important to material characterization

I MacLaren, TA Macgregor, CS Allen, AI Kirkland - Apl Materials, 2020 - pubs.aip.org
Detectors are revolutionizing possibilities in scanning transmission electron microscopy
because of the advent of direct electron detectors that record at a high quantum efficiency …

A pnCCD-based, fast direct single electron imaging camera for TEM and STEM

H Ryll, M Simson, R Hartmann, P Holl… - Journal of …, 2016 - iopscience.iop.org
We report on a new camera that is based on a pnCCD sensor for applications in scanning
transmission electron microscopy. Emerging new microscopy techniques demand improved …

[HTML][HTML] High dose efficiency atomic resolution imaging via electron ptychography

TJ Pennycook, GT Martinez, PD Nellist, JC Meyer - Ultramicroscopy, 2019 - Elsevier
Radiation damage places a fundamental limitation on the ability of microscopy to resolve
many types of materials at high resolution. Here we evaluate the dose efficiency of phase …

Analytical review of direct STEM imaging techniques for thin samples

I Lazić, EGT Bosch - Advances in Imaging and Electron Physics, 2017 - Elsevier
Scanning transmission electron microscopy (STEM) imaging, which has been in use for
many decades, is analyzed mathematically for thin nonmagnetic samples. The result is a …

Automated crystal orientation mapping by precession electron diffraction-assisted four-dimensional scanning transmission electron microscopy using a scintillator …

J Jeong, N Cautaerts, G Dehm… - Microscopy and …, 2021 - academic.oup.com
The recent development of electron-sensitive and pixelated detectors has attracted the use
of four-dimensional scanning transmission electron microscopy (4D-STEM). Here, we …