N Modolo, SW Tang, HJ Jiang… - … on Electron Devices, 2020 - ieeexplore.ieee.org
In this article, a physics-based analytical model which considers the channel charge (Q ch) for enhancement-mode p-GaN power high-electron-mobility transistors (HEMTs) is …
The dc characteristics of AlGaN/gallium nitride (GaN) metal-oxide-semiconductor-high electron mobility transistor (MOS-HEMT) with an AlInN back-barrier layer has been studied …
Z Bhat, SA Ahsan - IEEE Transactions on Electron Devices, 2024 - ieeexplore.ieee.org
This article introduces a physics-based framework for modeling drain current in p-GaN gate high electron mobility transistors (p-GaN HEMTs). The model is constructed on fundamental …
L Luo, J Liu, G Wang, Y Wu - Journal of Semiconductors, 2020 - iopscience.iop.org
This paper presents an accurate small-signal model for multi-gate GaAs pHEMTs in switching-mode. The extraction method for the proposed model is developed. A 2-gate …
In this paper, polarization-graded AlGaN back-barrier nanolayer has been introduced to improve the DC and RF parameters of gallium nitride-based high electron mobility …
In this paper an enhancement mode (E-mode) short channel N-polar GaN MOS-HEMT is proposed. In order to mitigate different short channel effects, workfunction engineering …
An improved small-signal parameter extraction technique for short channel enhancement- mode N-polar GaN MOS-HEMT is proposed, which is a combination of a conventional …
GP Rao, TR Lenka, R Singh, B Nour El I… - 2022 IEEE Calcutta …, 2022 - ieeexplore.ieee.org
Group III-nitride semiconductors such as (Al, Ga, In) N and their alloys have increasingly attracted the attention of worldwide researchers due to their unique material properties …
In this paper the drain current low-frequency noise (LFN) of E-mode GaN MOS-HEMT is investigated for different gate insulators such as SiO 2, Al 2 O 3/Ga 2 O 3/GdO 3, HfO 2/SiO …