Due to the lack of widely applicable fault models, testing for analog, mixedsignal (AMS), and
radio frequency (RF) circuits has been, and will continue to be, primarily based on checking …

A traditional specification-based core-level test method is no longer attractive in testing
deeply embedded analog and mixed-signal circuits due to limited accessibility and resource …

Mobile Agents have brought around a new way to perform computations and develop
distributed application and it is now struggling for a visible position in the area of distributed …

Parallel testing of mixed-signal circuits has been considered a difficult task due to the limited
resources in generating and analyzing multiple analog signals. A number of methods have …

Accurate measurement of aperture jitter for high-speed data converters is a difficult problem,
since aperture jitter should be precisely separated from other jitter components as well as …

It is well-known that complex SOCs with RF and embedded power management (PM)
modules require significant post manufacturing calibration to ensure that the device meets …

Modern mixed-signal/RF circuits with a digital calibration capability could achieve significant
performance improvement through calibration. However, the calibration process often takes …

This paper presents new test methods for nonlinear Analog and Mixed-Signal (AMS) circuits
which use a pseudorandom signal to test multiple Devices Under Test (DUTs) accurately …

Loopback tests for a differential mixed-signal device under test (DUT) have rarely been
attempted since any imbalance introduced by design-for-test (DfT) circuitry on differential …

The growing demand for high performance systems in modern computing technology drives
the development of advanced and high speed designs in I/O structures. Due to their data …