A wide variety of embedded instruments are increasingly integrated within modern System-
on-Chips (SoCs) for the purpose of monitoring, debugging, and testing. Integrating this …

LBIST has been proven to be an effective measure for reaching functional safety goals for
automotive microcontrollers. Due to a large variety of recent innovative features, every …

This work considers the use of a mixed structural-functional approach to path delay fault test
generation and compaction. K Longest Paths per Gate (KLPG) are generated using …

Currently, BDD packages such as CUDD depend on chained hash tables. Although they are
efficient in terms of memory usage, they exhibit poor cache performance due to dynamic …

In this paper we explore several properties of Structurally Synthesized Binary Decision
Diagrams (SSBDD), and based on these properties we propose a method for equivalent …

At the system level, cancer is viewed as the malfunctioning of proteins synthesized by the
mutated genes. One of the effective ways of cancer treatment is personalized combinational …

The first ideas of structural Binary Decision Diagrams (BDDs) date back to the 70s. The
primary motivation for introducing this model into the test field, initially under the name of …

Modern technologies have enabled the semiconductor industry to enter a new era of
integrated-circuit manufacturing. Modern ICs are not only smaller and significantly more high …

Boolean Satisfiability (SAT) solvers have been used to speed up test pattern generation. In
this work, several techniques to speed up SAT-based path delay test generation are …

According to Moore's law, Integrated Chips (IC) doubles its capacity every 18 months. This
causes an exponential increase of the available area, and hence, the complexity of modern …