Virtual metrology as an approach for product quality estimation in Industry 4.0: a systematic review and integrative conceptual framework

PA Dreyfus, F Psarommatis, G May… - International Journal of …, 2022 - Taylor & Francis
Virtual metrology (VM) involves estimating a product's quality directly from production
process data without physically measuring it. This enables the product quality of each unit of …

Decision-based virtual metrology for advanced process control to empower smart production and an empirical study for semiconductor manufacturing

CF Chien, WT Hung, CW Pan… - Computers & Industrial …, 2022 - Elsevier
Virtual metrology (VM) has been employed to improve the performance of advanced process
control for semiconductor manufacturing. A number of VM models have been proposed to …

Semi-supervised support vector regression based on self-training with label uncertainty: An application to virtual metrology in semiconductor manufacturing

P Kang, D Kim, S Cho - Expert Systems with Applications, 2016 - Elsevier
Dataset size continues to increase and data are being collected from numerous
applications. Because collecting labeled data is expensive and time consuming, the amount …

PrePass-Flow: A Machine Learning based technique to minimize ACL policy violation due to links failure in hybrid SDN

M Ibrar, L Wang, GM Muntean, A Akbar, N Shah… - Computer Networks, 2021 - Elsevier
The centralized architecture of Software-Defined Networking (SDN) reduces networking
complexity and improves network manageability by omitting the need for box-by-box …

IHSF: An intelligent solution for improved performance of reliable and time-sensitive flows in hybrid SDN-based FC IoT systems

M Ibrar, L Wang, GM Muntean, J Chen… - IEEE Internet of …, 2020 - ieeexplore.ieee.org
The integration of software-defined networking (SDN) into legacy networks causes both
operational and deployment issues. In this context, this article proposes a novel approach …

Using regression models for predicting the product quality in a tubing extrusion process

V García, JS Sánchez, LA Rodríguez-Picón… - Journal of Intelligent …, 2019 - Springer
Quality in a manufacturing process implies that the performance characteristics of the
product and the process itself are designed to meet specific objectives. Thus, accurate …

Spam SMS detection for Turkish language with deep text analysis and deep learning methods

O Karasoy, S Ballı - Arabian Journal for Science and Engineering, 2022 - Springer
With the increasing number of mobile users day by day, the security of mobile phones is an
important issue. SMS service available as standard in all users; advertising makes it a …

Recurrent feature-incorporated convolutional neural network for virtual metrology of the chemical mechanical planarization process

KB Lee, CO Kim - Journal of Intelligent Manufacturing, 2020 - Springer
In semiconductor manufacturing, the chemical mechanical planarization (CMP) process
produces higher thickness variability in the edge area of the wafer than that in the center …

Development of convolutional neural network based Gaussian process regression to construct a novel probabilistic virtual metrology in multi-stage semiconductor …

X Wu, J Chen, L Xie, LLT Chan, CI Chen - Control Engineering Practice, 2020 - Elsevier
Manufacturing of semiconductor chips involves hundreds of process steps. For high-
throughput semiconductor manufacturers, it is not feasible to get all the quality …

Online state‐of‐health prediction of lithium‐ion batteries with limited labeled data

J Yu, J Yang, Y Wu, D Tang… - International Journal of …, 2020 - Wiley Online Library
Summary State‐of‐health (SOH) plays a vital role in battery health management and power
system stability. This process can be achieved by capacity estimation. However, in practice …