This paper presents a brief history of scanning probe microscopes (SPMs) and a general
insight into an atomic force microscope (AFM), including its operating principles, modes …

In this paper, an integrated system, named dynamic force characterization microscopy
(DFCM), is proposed to investigate the detachment process at small scale. This system is …

The performance of the atomic force microscope (AFM), a nanoscale imaging tool, is
significantly influenced by the dynamics of the piezoelectric tube scanner (PTS). The …

When performing manipulation at small scales, the micro-robotic system and the vision
system axes often aren't aligned, leading to low accuracy. To asses this issue it is possible to …

A piezoelectric tube scanner (PTS) is made of a piezoelectric material (PZM) is used in an
atomic force microscopy (AFM) for sub-nanometre range positioning of a sample. High …