Probing material properties at surfaces down to the single-particle scale of atoms and
molecules has been achieved, but high-resolution subsurface imaging remains a …

On 29 December 1959 at the annual meeting of the American Physical Society, Richard
Feynman gave a lecture at the California Institute of Technology titled" There Is Plenty of …

Crystallization in glasses is usually considered to be a problem in the glass industry.
However, controlled crystallization of glasses is an important prerequisite in the …

We present a procedure for calibrated complex impedance measurements and dielectric
quantification with scanning microwave microscopy. The calibration procedure works in situ …

The optical and electronic properties of 2D semiconductors are intrinsically linked via the
strong interactions between optically excited bound species and free carriers. Here we use …

Fast scanning probe microscopy enabled via machine learning allows for a broad range of
nanoscale, temporally resolved physics to be uncovered. However, such examples for …

Research about two-dimensional (2D) materials is growing exponentially across various
scientific and engineering disciplines due to the wealth of unusual physical phenomena that …

We present a new method to extract resistivity and doping concentration of semiconductor
materials from Scanning Microwave Microscopy (SMM) S11 reflection measurements. Using …

The development of van der Waals (vdW) homojunction devices requires materials with
narrow bandgaps and simultaneously high hole and electron mobilities for bipolar transport …

With the development of microwave chips toward high integration, new challenges have
been posed to high-precision microwave field test techniques. In this article, we propose a …