On system reliability approaches: a brief survey

M Ram - International Journal of System Assurance Engineering …, 2013 - Springer
In the modern scenario, reliability has becomes the most challenging and demanding
theory. The theory and the methods of reliability analysis have been developed significantly …

A review of statistical methods for quality improvement and control in nanotechnology

JC Lu, SL Jeng, K Wang - Journal of Quality Technology, 2009 - Taylor & Francis
Nanotechnology has received a considerable amount of attention from various fields and
has become a multidisciplinary subject, where several research ventures have taken place …

Türkiye'de eğitim bilimleri alanında yapılmış doktora tezlerinin tematik ve metodolojik açıdan incelenmesi: Bir durum çalışması

E Karadağ - 2009 - search.proquest.com
i TC Marmara Üniversitesi Eğitim Bilimleri Enstitüsü İlköğretim Anabilim Dalı Sınıf
Öğretmenliği Bilim Dalı TÜ Page 1 i TC Marmara Üniversitesi Eğitim Bilimleri Enstitüsü …

Using Bayesian networks to accurately calculate the reliability of complementary metal oxide semiconductor gates

W Ibrahim, V Beiu - IEEE Transactions on Reliability, 2011 - ieeexplore.ieee.org
Scaling complementary metal oxide semiconductor (CMOS) devices has been a method
used very successfully over the last four decades to improve the performance and the …

Reliability research on micro-and nano-electromechanical systems: a review

A Arab, Q Feng - The International Journal of Advanced Manufacturing …, 2014 - Springer
Research on micro/nano-electro-mechanical system (MEMS/NEMS) reliability is of crucial
importance, due to the fact that we are facing an era in which MEMS and emerging NEMS …

Physics-driven Bayesian hierarchical modeling of the nanowire growth process at each scale

Q Huang - IIE transactions, 2010 - Taylor & Francis
Despite significant advances in nanoscience, current physical models are unable to predict
nanomanufacturing processes under uncertainties. This research work aims to model the …

A transistor-level probabilistic approach for reliability analysis of arithmetic circuits with applications to emerging technologies

B Srinivasu, K Sridharan - IEEE Transactions on Reliability, 2017 - ieeexplore.ieee.org
Several field-effect transistor (FET)-based device technologies are emerging as powerful
alternatives to the classical metal oxide semiconductor FET (mosfet) for computing …

[HTML][HTML] Bending fracture of ultra-thin plates with surface elasticity containing a thickness-through crack

ZL Hu, Y Yang, XF Li - International Journal of Solids and Structures, 2021 - Elsevier
The bending fracture of an ultra-thin plate containing a thickness-through crack with
consideration of surface elasticity is studied in this paper. Based on the Kirchhoff plate …

Effects of intermittent faults on the reliability of a reduced instruction set computing (RISC) microprocessor

J Gracia-Moran, JC Baraza-Calvo… - IEEE Transactions …, 2014 - ieeexplore.ieee.org
With the scaling of complementary metal-oxide-semiconductor (CMOS) technology to the
submicron range, designers have to deal with a growing number and variety of fault types. In …

Reliability assessment of the wind power density using uncertainty analysis

S Moghim - Sustainable Energy Technologies and Assessments, 2021 - Elsevier
Abstract Evaluation of the wind energy potential in different climates includes high level of
uncertainties. To address the uncertainties, this study performs reliability analysis by …