In-situ high temperature measurement in a scanning electron microscopy (SEM)
environment is an important technique for exploring the microstructure evolution and crack …

The combination of digital image correlation (DIC) and scanning electron microscopy (SEM)
enables to extract high resolution full field displacement data, based on the high spatial …

Digital image correlation of scanning electron microscope images is a powerful technique
for measuring full-field deformation at microstructural length scales. A major challenge in …

Understanding the mechanisms at the microstructure scale is of great importance for
modeling the behavior of materials at different scales. To this end, digital image correlation …

The accuracy of electron backscatter diffraction indexation has long been limited by pattern
center determination, and numerous hardware and software methods have been proposed …

For the precise determination of orientations in polycrystalline materials, electron
backscatter diffraction (EBSD) requires a consistent calibration of the diffraction geometry in …

Electron backscatter diffraction (EBSD) in the scanning electron microscope is routinely
used for microstructural characterisation of polycrystalline materials. Maps of EBSD data are …

Grain boundaries play a vital role in materials science, and they are extensively studied
through experimental and numerical methods. Electron backscatter diffraction (EBSD) is …

Accuracy and uncertainty analyses are essential for every measurement technology. In
crystal orientation indexation by electron backscatter diffraction (EBSD), a series of accuracy …

The present study extends the stereoscopic imaging principle for estimating the surface
topography to two orientations, namely, normal to the electron beam axis and inclined at 70° …