[图书][B] Harsh environment silicon carbide UV sensor and junction Field-Effect transistor
WC Lien - 2013 - search.proquest.com
A harsh environment can be defined by one or more of the following: High temperature, high
shock, high radiation, erosive flow, and corrosive media. Among all the harsh environment …
shock, high radiation, erosive flow, and corrosive media. Among all the harsh environment …
Application of Infrared Thermography to Non-Contact Testing of AC/AD Power Supply
S Galla, A Konczakowska - Facta Universitatis, Series …, 2015 - casopisi.junis.ni.ac.rs
Testing of AC/DC power supplies using the thermography was carried out in order to assess
their assembly and operation correctness before launching them on the market. The …
their assembly and operation correctness before launching them on the market. The …
Low frequency noise in silicon carbide and graphene electronics
HK Chan - 2015 - theses.ncl.ac.uk
The electrical noise phenomenon in semiconductor devices has been an on-going research
topic throughout the evolution of semiconductors, having been discovered in the …
topic throughout the evolution of semiconductors, having been discovered in the …