Electromigration in three-dimensional integrated circuits

Z Shen, S Jing, Y Heng, Y Yao, KN Tu… - Applied Physics Reviews, 2023 - pubs.aip.org
The development of big data and artificial intelligence technology is increasing the need for
electronic devices to become smaller, cheaper, and more energy efficient, while also having …

Failure mechanisms of solder interconnects under current stressing in advanced electronic packages

YC Chan, D Yang - Progress in Materials Science, 2010 - Elsevier
The pursuit of greater performance in microelectronic devices has led to a shrinkage of
bump size and a significant increase in electrical current. This has resulted in a high current …

Effect of Joule heating and current crowding on electromigration in mobile technology

KN Tu, Y Liu, M Li - Applied Physics Reviews, 2017 - pubs.aip.org
In the present era of big data and internet of things, the use of microelectronic products in all
aspects of our life is manifested by the ubiquitous presence of mobile devices as i-phones …

Electromigration and thermomigration in Pb-free flip-chip solder joints

C Chen, HM Tong, KN Tu - Annual Review of Materials …, 2010 - annualreviews.org
Pb-free solders have replaced Pb-containing SnPb solders in the electronic packaging
industry due to environmental concerns. Both electromigration (EM) and thermomigration …

In-situ isothermal aging TEM analysis of a micro Cu/ENIG/Sn solder joint for flexible interconnects

J Liu, J Xu, KW Paik, P He, S Zhang - Journal of Materials Science & …, 2024 - Elsevier
Sn/ENIG has recently been used in flexible interconnects to form a more stable micron-sized
metallurgical joint, due to high power capability which causes solder joints to heat up to 200° …

Four dimensional (4D) microstructural evolution of Cu6Sn5 intermetallic and voids under electromigration in bi-crystal pure Sn solder joints

MB Kelly, S Niverty, N Chawla - Acta Materialia, 2020 - Elsevier
Electromigration (EM) causes intermetallic and void growth that decreases the reliability and
lifetime of solder joints. As a diffusion-controlled process, EM is highly dependent on the …

Insulator-on-Conductor Fouling Amplifies Aqueous Electrolysis Rates

HM Rodriguez, M Martyniuk, KS Iyer… - Journal of the American …, 2024 - ACS Publications
The chemical industry is a major consumer of fossil fuels. Several chemical reactions of
practical value proceed with the gain or loss of electrons, opening a path to integrate …

Effect of Ni and Co nanoparticle-doped flux on microstructure of SAC305 solder matrix

MN Bashir, A Haseeb, S Wakeel, MA Khan… - Journal of Materials …, 2022 - Springer
Microstructure of the eutectic region and β-Sn grain of the solder matrix play an important
role in the properties of the Sn-based solder joint. In the present study, Ni and Co …

Study of electromigration-induced formation of discrete voids in flip-chip solder joints by in-situ 3D laminography observation and finite-element modeling

YW Chang, Y Cheng, F Xu, L Helfen, T Tian… - Acta Materialia, 2016 - Elsevier
In the microelectronics industry the flip-chip (FC) technology is broadly used to enhance the
packaging density. However, the small size and the unique geometry of the FC solder joints …

A new failure mechanism of electromigration by surface diffusion of Sn on Ni and Cu metallization in microbumps

YW Chang, C Hu, HY Peng, YC Liang, C Chen… - Scientific reports, 2018 - nature.com
Microbumps in three-dimensional integrated circuit now becomes essential technology to
reach higher packaging density. However, the small volume of microbumps dramatically …