Thermo-Mechanical Challenges of 2.5 D Packaging: A Review of Warpage and Interconnect Reliability

H Kim, JY Hwang, SE Kim, YC Joo… - IEEE Transactions on …, 2023 - ieeexplore.ieee.org
Advanced packaging technology, also known as system scaling, bridges the gap between
chip and package sizes by mounting multiple chips on a single package substrate. 2.5-D …

Lidless and lidded flip chip packages for advanced applications

G Refai-Ahmed, H Wang, S Ramalingam… - 2020 IEEE 22nd …, 2020 - ieeexplore.ieee.org
Thermal management and reliability are two critical aspects of designing an advanced flip
chip package. Lidded and lidless are one of the most important variations depending on …

Thermal and mechanical characterization of 2.5-D and fan-out chip on substrate chip-first and chip-last packages

MK Shih, W Lai, T Liao, K Chen… - IEEE Transactions on …, 2022 - ieeexplore.ieee.org
Heterogeneous integration technology makes possible the integration of multiple separately
manufactured components into a single higher level assembly with enhanced functionality …

Finite element analysis of 2.5 D packaging processes based on multi-physics field coupling for predicting the reliability of IC components

W Li, X Wang, R Zheng, X Zhao, H Zheng… - Microelectronics …, 2024 - Elsevier
The 2.5 D packaging technology is a high–performance method for electronic packaging.
This study addresses the reliability issues of 2.5 D packaging during the manufacturing …

Correction of thermal airflow distortion in warpage measurements of microelectronic packaging structures via deep learning-based digital image correlation

Y Gao, Y Chen, Z Yu, C Xiong, X Lei, W Lv… - Microsystems & …, 2024 - nature.com
The projected speckle-based three-dimensional digital image correlation method (3D-DIC)
is being increasingly used in the reliability measurement of microelectronic packaging …

Analytical study on the warpage deformation of die attach structure in power devices

X Luan, L Ding, X Li, H Zhang, K Li… - IEEE Transactions on …, 2024 - ieeexplore.ieee.org
According to the theory of elastic–plastic mechanics, the stress and deformation of a die
attach structure under a temperature load were studied. An analytical relation between the …

Reliability Evaluation of Board-Level Flip-Chip Package under Coupled Mechanical Compression and Thermal Cycling Test Conditions

MK Shih, YH Liu, C Lee, CP Hung - Materials, 2023 - mdpi.com
Flip Chip Ball Grid Array (FCBGA) packages, together with many other heterogeneous
integration packages, are widely used in high I/O (Input/Output) density and high …

Chip warpage and stress analysis in power modules of different substrate configurations

MA Gharaibeh - Soldering & Surface Mount Technology, 2025 - emerald.com
Purpose This paper aims to use rigorous finite element simulations to investigate the impact
of different substrate systems on the warpage behavior of silicon (Si) chips of power …

Insulation degradation analysis due to thermo-mechanical stress in deep-sea oil-filled motors

J Zhang, R Wang, Y Fang, Y Lin - Energies, 2022 - mdpi.com
With the wide application of motors in deep sea exploration, deep-sea motors require a
higher power density and a longer lifetime. Motor lifetime mainly depends on the thermo …

Thermal Cycle Reliability of Copper Pillar Bumps in Advanced Fan-Out Packages

MK Shih, SJ Chen, IH Lin, BY Lou, T Ni - Journal of Electronic Materials, 2024 - Springer
Fan-out (FO) packages are in high demand for smartphones and Internet of Things (IoT)
devices because they allow for the integration of multiple components within a single …