Changes and challenges of photovoltaic inverter with silicon carbide device

Z Zeng, W Shao, H Chen, B Hu, W Chen, H Li… - … and Sustainable Energy …, 2017 - Elsevier
High efficiency, high power density, and high reliability are always the technical trends of
converters for renewable energy applications. Silicon carbide (SiC) devices can break …

Short-Circuit Characterization and Protection of 10-kV SiC mosfet

S Ji, M Laitinen, X Huang, J Sun… - … on Power Electronics, 2018 - ieeexplore.ieee.org
This paper presents the characterization of the temperature-dependent short-circuit
performance of a Gen3 10 kV/20 A silicon carbide (SiC) mosfet. The test platform consisting …

An integrated GaN overcurrent protection circuit for power HEMTs using SenseHEMT

WL Jiang, SK Murray, MS Zaman… - … on Power Electronics, 2022 - ieeexplore.ieee.org
GaN power high-electron-mobility transistors (HEMTs), with their fast switching transients
and poor overcurrent tolerance, require overcurrent protection (OCP) circuits that can …

Review of methodologies for evaluating short-circuit robustness and reliability of SiC power MOSFETs

R Cui, Z Xin, Q Liu, J Kang, H Luo… - IEEE Journal of …, 2021 - ieeexplore.ieee.org
To accelerate the broad application of silicon carbide (SiC) power MOSFETs, their short-
circuit (SC) robustness and reliability must be thoroughly evaluated. This article, therefore …

Short-circuit performance of multi-chip SiC MOSFET modules

A Kadavelugu, E Aeloiza… - 2017 IEEE 5th Workshop …, 2017 - ieeexplore.ieee.org
This paper presents short-circuit test results on commercial, multi-chip 1200 V SiC MOSFET
half-bridge modules up to 860 V dc, suitable for three-phase 480 V grid-interfaced …

Short circuit characterization of 3rd generation 10 kV SiC MOSFET

S Ji, M Laitinen, X Huang, J Sun… - 2018 IEEE Applied …, 2018 - ieeexplore.ieee.org
The short circuit performance of a 3 rd generation 10 kV/20 A SiC MOSFET with short
channel is characterized in this paper. The platform consisting of a phase-leg configuration …

Comparison of thermal stress during short-circuit in different types of 1.2-kV SiC transistors based on experiments and simulations

DP Sadik, J Colmenares, JK Lim… - IEEE Transactions …, 2020 - ieeexplore.ieee.org
The temperature evolution during a short-circuit (SC) fault in the dies of three different silicon
carbide (SiC) 1200-V power devices is presented in this article. Transient electrothermal …

Selection methodology for Si power MOSFETs used to enhance SiC power MOSFET short-circuit capability with the BaSIC (EMM) topology

A Kanale, BJ Baliga - IEEE Transactions on Power Electronics, 2020 - ieeexplore.ieee.org
The BaSIC (EMM) topology has been previously demonstrated to improve the short-circuit
(SC) capability of 1.2-kV SiC power MOSFETs from 3.5 to 7.4 μs while producing a 17 …

Theoretical optimization of the Si GSS-DMM device in the BaSIC topology for SiC power MOSFET short-circuit capability improvement

A Kanale, BJ Baliga - IEEE Access, 2021 - ieeexplore.ieee.org
The BaSIC (DMM) topology has been experimentally demonstrated to improve the short-
circuit time for a 1.2 kV SiC power MOSFET product from 4.8 μs to 7.9 μs with a 17 …

An experimental demonstration of short circuit protection of SiC Devices

E Aeloiza, A Kadavelugu, P Cairoli… - Materials Science …, 2018 - Trans Tech Publ
An experimental demonstration of an effective short circuit protection scheme for SiC
MOSFETs is presented in this paper. Measurements of the static characteristics of the SiC …