Efficient In Situ Doping of Strained Germanium Tin Epilayers at Unusually Low Temperature

M Myronov, P Jahandar, S Rossi… - Advanced Electronic …, 2024 - Wiley Online Library
Efficient p‐and n‐type in situ doping of compressively strained germanium tin (Ge1‐xSnx)
semiconductor epilayers, grown by chemical vapor deposition on a standard Si (001) …

Surfactant behavior and limited incorporation of indium during in situ doping of GeSn grown by molecular beam epitaxy

A Giunto, LE Webb, T Hagger… - Physical Review …, 2023 - APS
GeSn is a promising group-IV semiconductor material for on-chip Si photonics devices and
high-mobility transistors. These devices require the use of doped GeSn regions, achieved …

Effects of ion implantation with arsenic and boron in germanium-tin layers

S Amoah, H Stanchu, G Abernathy, S Kryvyi… - Journal of Vacuum …, 2024 - pubs.aip.org
Ion implantation is widely used in the complementary metal–oxide–semiconductor process,
which stimulates to study its role for doping control in rapidly emerging group IV Ge 1− x Sn …

Very low temperature epitaxy of group-IV semiconductors for use in FinFET, stacked nanowires and monolithic 3D integration

C Porret, A Hikavyy, JFG Granados… - ECS Journal of Solid …, 2019 - iopscience.iop.org
As CMOS scaling proceeds with sub-10 nm nodes, new architectures and materials are
implemented to continue increasing performances at constant footprint. Strained and …

Toward high-performance and reliable Ge channel devices for 2 nm node and beyond

H Arimura, E Capogreco, A Vohra… - 2020 IEEE …, 2020 - ieeexplore.ieee.org
This paper describes our recent research progress on high-mobility Ge-channel n/pFETs.
Gate stack, junction and contact are the key challenging components of Ge n/pFETs …

[HTML][HTML] Evolution of phases and their thermal stability in Ge–Sn nanofilms: a comprehensive in situ TEM investigation

A Minenkov, H Groiss - Journal of Alloys and Compounds, 2021 - Elsevier
Abstract The group IV Ge-Sn system is a promising candidate for a variety of electronic and
photonic applications due to its tunable bandgap and compatibility with Si-based …

Formation and characterization of Ni, Pt, and Ti stanogermanide contacts on Ge0. 92Sn0. 08

E Galluccio, N Petkov, G Mirabelli, J Doherty, SY Lin… - Thin Solid Films, 2019 - Elsevier
In this article we provide a comparative and systematic study on contact formation for
germanium-tin (GeSn) thin films containing a high percentage of Sn (8 at.%). 20 nm of Nickel …

[HTML][HTML] Area-selective deposition of germanium on patterned graphene/monolayer molybdenum disulfide stacks via dipole engineering

Y Lee, T Ahmed, X Wang, MT Pettes, Y Kim, J Park… - APL Materials, 2024 - pubs.aip.org
Heterogeneous integration of two-dimensional materials and the conventional
semiconductor has opened opportunities for next-generation semiconductor devices and …

Thermal Stability and Sn Segregation of Low-Resistance Ti/p+-Ge0.95Sn0.05 Contact

Y Wu, H Xu, K Han, X Gong - IEEE Electron Device Letters, 2019 - ieeexplore.ieee.org
The thermal stability and contact property of Ti/p+-Ge 0.95 Sn 0.05 contact are investigated
for the first time. Sn segregation is observed under the Ti/GeSn interface after the post-metal …

Low‐Temperature Selective Growth of Heavily Boron‐Doped Germanium Source/Drain Layers for Advanced pMOS Devices

C Porret, A Vohra, N Nakazaki, A Hikavyy… - … status solidi (a), 2020 - Wiley Online Library
The peculiarities of heavily boron‐doped germanium, selectively grown at low temperature
by means of a cyclic deposition and etch chemical vapor deposition process, are …