We present the performance characteristics of a Single Photon Avalanche Detector fabricated in a 180 nm standard CMOS image sensor technology. The SPAD implemented …
We present the performance characteristics of a single photon avalanche diode (SPAD) fabricated in a 180 nm standard CMOS image sensor technology. The SPAD structure was …
Time-correlated single-photon counting (TCSPC) applications usually deal with a high counting rate, which leads to a decrease in the system efficiency. This problem is further …