Ion beams in materials processing and analysis

B Schmidt, K Wetzig - 2012 - books.google.com
A comprehensive review of ion beam application in modern materials research is provided,
including the basics of ion beam physics and technology. The physics of ion-solid …

Axial lifetime control in silicon power diodes by irradiation with protons, alphas, low-and high-energy electrons

P Hazdra, J Vobecký, H Dorschner, K Brand - Microelectronics Journal, 2004 - Elsevier
Local lifetime control by proton and alpha-particle irradiation with energies from 1.8 to 12.1
MeV and doses up to 5× 1012cm− 2 was faced with two types of electron irradiation giving …

A fast and soft reverse recovery diode with a Punch-Through NPN structure

X Peng, Y Liu, H Feng, L Huang… - IEEE Electron Device …, 2022 - ieeexplore.ieee.org
A fast and soft reverse recovery diode with a Punch-Through (PT) NPN structure is proposed
and experimentally demonstrated. The structure features a P-type Schottky contact, a PT …

Optimization of SiC power pin diode parameters by proton irradiation

P Hazdra, S Popelka, A Schöner - IEEE Transactions on …, 2018 - ieeexplore.ieee.org
Local lifetime reduction by proton irradiation was used to optimize the static and dynamic
parameters of a 10 kV SiC pin diode. Carrier lifetime was reduced locally at the anode side …

Investigation of the damage as induced by 1.7 MeV protons in an amorphous/crystalline silicon heterojunction solar cell

HC Neitzert, P Spinillo, S Bellone, GD Licciardi… - Solar energy materials …, 2004 - Elsevier
Current–voltage under illumination and quantum yield characteristics of an amorphous
silicon/crystalline silicon hetero solar cell have been measured before and after exposure to …

Local lifetime control in 4H-SiC by proton irradiation

P Hazdra, S Popelka, A Schöner - Materials Science Forum, 2018 - Trans Tech Publ
The effect of local lifetime control by proton irradiation on the OCVD response of a 10 kV SiC
PiN diode was investigated. Carrier lifetime was reduced locally by irradiation with 800 keV …

Fast reverse recovery body diode in high-voltage VDMOSFET using cell-distributed Schottky contacts

X Cheng, JKO Sin, B Kang, C Feng… - IEEE Transactions on …, 2003 - ieeexplore.ieee.org
A new approach to improve the high-voltage vertical double-diffused MOSFET (VDMOSFET)
body-diode recovery speed is proposed. In this approach, a Schottky contact is integrated …

Impedance and barrier capacitance of silicon diodes implanted with high-energy Xe ions

NA Poklonski, NI Gorbachuk, SV Shpakovski… - Microelectronics …, 2010 - Elsevier
Characteristics of Si p+ n diodes with non-uniformly distributed compensating defects, which
were introduced by implantation with Xe23+ ions, have been studied. The layer with the …

Radiation-enhanced diffusion of palladium for a local lifetime control in power devices

J Vobecky, P Hazdra - IEEE Transactions on Electron Devices, 2007 - ieeexplore.ieee.org
Palladium (Pd) diffusion from a surface layer enhanced by defects from a helium (He)
irradiation is shown to provide a local lifetime control in a power pin diode annealed …

[HTML][HTML] Effect of proton irradiation induced localized defect clusters on recovery time and leakage current in silicon photoconductive semiconductor switches

JKP Bhamidipati, G Bhattarai, AN Caruso - AIP Advances, 2023 - pubs.aip.org
Pulse recovery time in semiconducting devices depends strongly on minority carrier lifetime,
bandgap-type-dependent recombination, impurity concentration, and subband placement. In …