Non-invasive fault injection attacks have emerged as significant threats to a spectrum of
microelectronic systems ranging from commodity devices to high-end customized …

As a result of CMOS scaling, radiation-induced Single-Event Effects (SEEs) in electronic
circuits became a critical reliability issue for modern Integrated Circuits (ICs) operating under …

The ease and inexpensive setup of injecting timing faults in a hardware design make it
vulnerable to adversaries, resulting in confidentiality or integrity violations. The state-of-the …

With the downscaling of CMOS technologies, the radiation-induced Single Event Transient
(SET) effects in combinational logic have become a critical reliability issue for modern …

Reliability and fault tolerance needs in space applications pose additional requirements to
the chip design flow. In order to successfully cope with space related issues, cross-layer …

This paper presents the impact of radiation-induced Single-Event Multiple Transients
(SEMT) in All Digital Delay-Locked Loop (ADDLL) and its impact on the output of frequency …

The aim of alternative fault tolerant techniques used in flash-based FPGAs, such as Single
Event Transient (SET) filters, is to provide a resource savings advantage when compared to …

Adders and multipliers serve as critical components in the harsh environmental conditions of
space and mission-critical systems, where radiation and high temperatures pose significant …