[HTML][HTML] Transport of intensity equation: a tutorial

C Zuo, J Li, J Sun, Y Fan, J Zhang, L Lu… - Optics and Lasers in …, 2020 - Elsevier
When it comes to “phase measurement” or “quantitative phase imaging”, many people will
automatically connect them with “laser” and “interferometry”. Indeed, conventional …

4D-STEM ptychography for electron-beam-sensitive materials

G Li, H Zhang, Y Han - ACS Central Science, 2022 - ACS Publications
Recent advances in high-speed pixelated electron detectors have substantially facilitated
the implementation of four-dimensional scanning transmission electron microscopy (4D …

Four-dimensional scanning transmission electron microscopy (4D-STEM): From scanning nanodiffraction to ptychography and beyond

C Ophus - Microscopy and Microanalysis, 2019 - cambridge.org
Scanning transmission electron microscopy (STEM) is widely used for imaging, diffraction,
and spectroscopy of materials down to atomic resolution. Recent advances in detector …

Electron ptychography of 2D materials to deep sub-ångström resolution

Y Jiang, Z Chen, Y Han, P Deb, H Gao, S Xie, P Purohit… - Nature, 2018 - nature.com
Aberration-corrected optics have made electron microscopy at atomic resolution a
widespread and often essential tool for characterizing nanoscale structures. Image …

Visualization of oxygen vacancies and self-doped ligand holes in La3Ni2O7−δ

Z Dong, M Huo, J Li, J Li, P Li, H Sun, L Gu, Y Lu… - Nature, 2024 - nature.com
The recent discovery of superconductivity in La3Ni2O7− δ under high pressure with a
transition temperature around 80 K (ref.) has sparked extensive experimental,,,–and …

Embedded pupil function recovery for Fourier ptychographic microscopy

X Ou, G Zheng, C Yang - Optics express, 2014 - opg.optica.org
We develop and test a pupil function determination algorithm, termed embedded pupil
function recovery (EPRY), which can be incorporated into the Fourier ptychographic …

Mixed-state electron ptychography enables sub-angstrom resolution imaging with picometer precision at low dose

Z Chen, M Odstrcil, Y Jiang, Y Han, MH Chiu… - Nature …, 2020 - nature.com
Both high resolution and high precision are required to quantitatively determine the atomic
structure of complex nanostructured materials. However, for conventional imaging methods …

Simultaneous atomic-resolution electron ptychography and Z-contrast imaging of light and heavy elements in complex nanostructures

H Yang, RN Rutte, L Jones, M Simson… - Nature …, 2016 - nature.com
The aberration-corrected scanning transmission electron microscope (STEM) has emerged
as a key tool for atomic resolution characterization of materials, allowing the use of imaging …

Translation position determination in ptychographic coherent diffraction imaging

F Zhang, I Peterson, J Vila-Comamala, A Diaz… - Optics express, 2013 - opg.optica.org
Accurate knowledge of translation positions is essential in ptychography to achieve a good
image quality and the diffraction limited resolution. We propose a method to retrieve and …

Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution

TJ Pennycook, AR Lupini, H Yang, MF Murfitt, L Jones… - Ultramicroscopy, 2015 - Elsevier
We demonstrate a method to achieve high efficiency phase contrast imaging in aberration
corrected scanning transmission electron microscopy (STEM) with a pixelated detector. The …