G Li, H Zhang, Y Han - ACS Central Science, 2022 - ACS Publications
Recent advances in high-speed pixelated electron detectors have substantially facilitated the implementation of four-dimensional scanning transmission electron microscopy (4D …
C Ophus - Microscopy and Microanalysis, 2019 - cambridge.org
Scanning transmission electron microscopy (STEM) is widely used for imaging, diffraction, and spectroscopy of materials down to atomic resolution. Recent advances in detector …
Aberration-corrected optics have made electron microscopy at atomic resolution a widespread and often essential tool for characterizing nanoscale structures. Image …
Z Dong, M Huo, J Li, J Li, P Li, H Sun, L Gu, Y Lu… - Nature, 2024 - nature.com
The recent discovery of superconductivity in La3Ni2O7− δ under high pressure with a transition temperature around 80 K (ref.) has sparked extensive experimental,,,–and …
We develop and test a pupil function determination algorithm, termed embedded pupil function recovery (EPRY), which can be incorporated into the Fourier ptychographic …
Both high resolution and high precision are required to quantitatively determine the atomic structure of complex nanostructured materials. However, for conventional imaging methods …
H Yang, RN Rutte, L Jones, M Simson… - Nature …, 2016 - nature.com
The aberration-corrected scanning transmission electron microscope (STEM) has emerged as a key tool for atomic resolution characterization of materials, allowing the use of imaging …
Accurate knowledge of translation positions is essential in ptychography to achieve a good image quality and the diffraction limited resolution. We propose a method to retrieve and …
We demonstrate a method to achieve high efficiency phase contrast imaging in aberration corrected scanning transmission electron microscopy (STEM) with a pixelated detector. The …