In this paper, we provide a systematic review of atomic force microscopy (AFM), a fast-
developing technique that embraces scanners, controllers, and cantilevers. The main …

We develop a theory that explains the origin of the high force sensitivity observed in
multifrequency force microscopy experiments. The ability of the microscope to extract …

Euler-Bernoulli beam theory is widely used to successfully predict the linear dynamics of
micro-and nanocantilever beams. However, its capacity to characterize the nonlinear …

High spatial resolution imaging of material properties is an important task for the continued
development of nanomaterials and studies of biological systems. Time-varying interaction …

We explore the feasibility of growing a continuous layer of graphene in prepatterned
substrates, like an engineered silicon wafer, and we apply this as a mold for the fabrication …

Kelvin probe force microscopy (KPFM) adapts an atomic force microscope to measure
electric potential on surfaces at nanometer length scales. Here we demonstrate that …

During dynamic atomic force microscopy (AFM), the deflection of a scanning cantilever
generates multiple frequency terms due to the nonlinear nature of AFM tip–sample …

Microcantilevers are at the heart of atomic force microscopy (AFM) and play a significant role
in AFM‐based techniques. Recent advancements in multifrequency AFM require the …

The effective Q-factor of the cantilever is one of the most important figures-of-merit for a non-
contact atomic force microscope (NC-AFM) operated in ultra-high vacuum (UHV). We …

This paper is concerned with the flexural vibration of an atomic force microscope (AFM)
cantilever. The cantilever problem is formulated on the basis of the modified couple stress …