WC Jhang, TC Hsieh, XZ Zhang, ZR Qiu… - … on Electron Devices, 2024 - ieeexplore.ieee.org
In this article, write-once-read-many-times (WORM) memory behavior of HfZrO (HZO)
ferroelectric material is demonstrated. A stoichiometric Hf0. 5Zr0. 5O2 thin film prepared …