In this article, threading dislocations and its impact on the electrical and thermal performance of GaN‐on‐Diamond (Dia),‐SiC, and‐Si high electron mobility transistor …
In this report, the gate leakage mechanism for AlGaN/GaN high electron mobility transistors (HEMTs) is consistently analyzed by means of temperature-dependent reverse gate current …
GaN HEMTs and MMICs are candidates for use in space system because of their many advantages especially as Rf/microwave amplifiers. To date however, although efforts are …
Currently, defects existing in materials and at the interface are the main bottlenecks limiting the manufacture of high-performance electron devices, especially semiconductor devices …
Y Wang, ME Liao, K Huynh, W Olsen… - ECS Journal of Solid …, 2022 - iopscience.iop.org
In this work, the effects of the substrate defect density and distribution on the reverse leakage behavior of GaN vertical Schottky diodes and p–i–n diodes are investigated. A …
M Zhang, H Wang, L Yang, B Hou, M Wu… - IEEE Journal of the …, 2023 - ieeexplore.ieee.org
In this paper, an integrated device which realized the dual-mode integration of power amplifier (PA) and radio frequency (RF) switch based on GaN dual-gate (DG) structure is …
In AlGaN/GaN high electron mobility transistors (HEMTs), the existence of long lifetime surface traps can cause several adverse effects, including threshold voltage () instability and …
In this work, we report on the electrical characteristics of Pt/Au Schottky contacts to Al 0.2 Ga 0.8 N/GaN heterostructures. Indeed, we have realized gate current-voltage I (V) and deep …
B Zhou, C Liu, C Guo, X Hu, X Jian, H Wang, X Yang - Micromachines, 2024 - mdpi.com
In this paper, high-temperature storage of hydrogen-treated AlGaN/GaN HEMTs is conducted for the first time to study the effect of high temperature on the electrical …