6G roadmap for semiconductor technologies: Challenges and advances

N Cahoon, P Srinivasan… - 2022 IEEE International …, 2022 - ieeexplore.ieee.org
The sub-THz spectrum between 100GHz and 300GHz is of great interest for achieving next
generation 6G cellular network goals of ultra-high data rate, ultra-low latency and high …

On the performance of GaN‐on‐silicon, silicon‐carbide, and diamond substrates

A Jarndal, L Arivazhagan… - International Journal of RF …, 2020 - Wiley Online Library
In this article, threading dislocations and its impact on the electrical and thermal
performance of GaN‐on‐Diamond (Dia),‐SiC, and‐Si high electron mobility transistor …

Evidence of Poole-frenkel and Fowler-Nordheim tunneling transport mechanisms in leakage current of (Pd/Au)/Al0. 22Ga0. 78N/GaN heterostructures

I Jabbari, M Baira, H Maaref, R Mghaieth - Solid State Communications, 2020 - Elsevier
In this report, the gate leakage mechanism for AlGaN/GaN high electron mobility transistors
(HEMTs) is consistently analyzed by means of temperature-dependent reverse gate current …

Guidelines for space qualification of GaN HEMTs and MMICs

J Scarpulla - 2021 IEEE International Reliability Physics …, 2021 - ieeexplore.ieee.org
GaN HEMTs and MMICs are candidates for use in space system because of their many
advantages especially as Rf/microwave amplifiers. To date however, although efforts are …

Low temperature defect passivation technology for semiconductor electronic devices—Supercritical fluids treatment process

TC Chang, PH Chen, CY Lin, CC Shih - Materials Today Physics, 2020 - Elsevier
Currently, defects existing in materials and at the interface are the main bottlenecks limiting
the manufacture of high-performance electron devices, especially semiconductor devices …

Investigation of the Reverse Leakage Behavior and Substrate Defects in Vertical GaN Schottky and PIN Diodes

Y Wang, ME Liao, K Huynh, W Olsen… - ECS Journal of Solid …, 2022 - iopscience.iop.org
In this work, the effects of the substrate defect density and distribution on the reverse
leakage behavior of GaN vertical Schottky diodes and p–i–n diodes are investigated. A …

The Dual-Mode Integration of Power Amplifier and Radio Frequency Switch Based on GaN Dual-Gate HEMTs

M Zhang, H Wang, L Yang, B Hou, M Wu… - IEEE Journal of the …, 2023 - ieeexplore.ieee.org
In this paper, an integrated device which realized the dual-mode integration of power
amplifier (PA) and radio frequency (RF) switch based on GaN dual-gate (DG) structure is …

Nanometer-Thick Insertion Layer for the Effective Passivation of Surface Traps and Improved Edge Acuity for AlGaN/GaN HEMTs

O Odabasi, A Ghobadi, TGU Ghobadi… - … on Electron Devices, 2023 - ieeexplore.ieee.org
In AlGaN/GaN high electron mobility transistors (HEMTs), the existence of long lifetime
surface traps can cause several adverse effects, including threshold voltage () instability and …

Hole trap, leakage current and barrier inhomogeneity in (Pt/Au) Al0. 2Ga0. 8N/GaN heterostructures

S Saadaoui, O Fathallah, F Albouchi… - Journal of Physics and …, 2019 - Elsevier
In this work, we report on the electrical characteristics of Pt/Au Schottky contacts to Al 0.2 Ga
0.8 N/GaN heterostructures. Indeed, we have realized gate current-voltage I (V) and deep …

Effect of High-Temperature Storage on Electrical Characteristics of Hydrogen-Treated AlGaN/GaN High-Electron-Mobility Transistors

B Zhou, C Liu, C Guo, X Hu, X Jian, H Wang, X Yang - Micromachines, 2024 - mdpi.com
In this paper, high-temperature storage of hydrogen-treated AlGaN/GaN HEMTs is
conducted for the first time to study the effect of high temperature on the electrical …