On-Chip Heater Design and Control Methodology for Reliability Testing Applications Requiring Over 300° C Local Temperatures
This paper presents the design details and control methodologies for on-chip heaters that
can provide fast and accurate local temperature control for reliability testing applications …
can provide fast and accurate local temperature control for reliability testing applications …
A 16nm all-digital hardware monitor for evaluating electromigration effects in signal interconnects through bit-error-rate tracking
The impact of Electromigration (EM) on the Bit-Error-Rate (BER) of signal interconnect paths
was experimentally examined. An array-based test-vehicle for tracking Bit-Error-Rate (BER) …
was experimentally examined. An array-based test-vehicle for tracking Bit-Error-Rate (BER) …
Studying the Impact of Temperature Gradient on Electromigration Lifetime Using a Power Grid Test Structure with On-Chip Heaters
This work presents statistical data collected from 38 power grid test structures showing the
detailed impact of temperature gradient on electro migration (EM) lifetime. The failure time …
detailed impact of temperature gradient on electro migration (EM) lifetime. The failure time …