Nanowire electronics: from nanoscale to macroscale

C Jia, Z Lin, Y Huang, X Duan - Chemical reviews, 2019 - ACS Publications
Semiconductor nanowires have attracted extensive interest as one of the best-defined
classes of nanoscale building blocks for the bottom-up assembly of functional electronic and …

Status and prospects of Al2O3-based surface passivation schemes for silicon solar cells

G Dingemans, WMM Kessels - … of Vacuum Science & Technology A, 2012 - pubs.aip.org
The reduction in electronic recombination losses by the passivation of silicon surfaces is a
critical enabler for high-efficiency solar cells. In 2006, aluminum oxide (Al 2 O 3) nanolayers …

Physical properties of composites near percolation

CW Nan, Y Shen, J Ma - Annual Review of Materials Research, 2010 - annualreviews.org
Dramatic changes in the physical properties of composites occur when filler particles form a
percolating network through the composite, particularly when the difference between the …

High dielectric constant oxides

J Robertson - The European Physical Journal-Applied Physics, 2004 - cambridge.org
The scaling of complementary metal oxide semiconductor (CMOS) transistors has led to the
silicon dioxide layer used as a gate dielectric becoming so thin (1.4 nm) that its leakage …

Influence of TM elements on the mechanical and thermodynamic properties of Hf2Si intermetallics

C Li, X Zhang, F Wang - Vacuum, 2024 - Elsevier
In order to improve the properties of Hf 2 Si, we design six transition metals (TM= Zr, Nb, Mo,
Tc, W and Re) doped in Hf 2 Si. The effect of TM elements on the properties of Hf 2 Si was …

High dielectric constant gate oxides for metal oxide Si transistors

J Robertson - Reports on progress in Physics, 2005 - iopscience.iop.org
The scaling of complementary metal oxide semiconductor transistors has led to the silicon
dioxide layer, used as a gate dielectric, being so thin (1.4 nm) that its leakage current is too …

Low dielectric constant materials for microelectronics

K Maex, MR Baklanov, D Shamiryan, F Lacopi… - Journal of Applied …, 2003 - pubs.aip.org
The ever increasing requirements for electrical performance of on-chip wiring has driven
three major technological advances in recent years. First, copper has replaced Aluminum as …

Yield, variability, reliability, and stability of two-dimensional materials based solid-state electronic devices

M Lanza, Q Smets, C Huyghebaert, LJ Li - Nature communications, 2020 - nature.com
The importance of statistical analyses on 2D materials-based electronic devices and circuits
is sometimes overlooked. Here the authors discuss the most pressing integration issues for …

Self assembled monolayers on silicon for molecular electronics

DK Aswal, S Lenfant, D Guérin, JV Yakhmi… - Analytica chimica …, 2006 - Elsevier
We present an overview of various aspects of the self-assembly of organic monolayers on
silicon substrates for molecular electronics applications. Different chemical strategies …

Radiation effects in a post-Moore world

DM Fleetwood - IEEE Transactions on Nuclear Science, 2021 - ieeexplore.ieee.org
An overview is presented of the significant influences of Moore's Law scaling on radiation
effects on microelectronics, focusing on historical trends and future needs. A number of …