G Dingemans, WMM Kessels - … of Vacuum Science & Technology A, 2012 - pubs.aip.org
The reduction in electronic recombination losses by the passivation of silicon surfaces is a critical enabler for high-efficiency solar cells. In 2006, aluminum oxide (Al 2 O 3) nanolayers …
CW Nan, Y Shen, J Ma - Annual Review of Materials Research, 2010 - annualreviews.org
Dramatic changes in the physical properties of composites occur when filler particles form a percolating network through the composite, particularly when the difference between the …
J Robertson - The European Physical Journal-Applied Physics, 2004 - cambridge.org
The scaling of complementary metal oxide semiconductor (CMOS) transistors has led to the silicon dioxide layer used as a gate dielectric becoming so thin (1.4 nm) that its leakage …
In order to improve the properties of Hf 2 Si, we design six transition metals (TM= Zr, Nb, Mo, Tc, W and Re) doped in Hf 2 Si. The effect of TM elements on the properties of Hf 2 Si was …
J Robertson - Reports on progress in Physics, 2005 - iopscience.iop.org
The scaling of complementary metal oxide semiconductor transistors has led to the silicon dioxide layer, used as a gate dielectric, being so thin (1.4 nm) that its leakage current is too …
The ever increasing requirements for electrical performance of on-chip wiring has driven three major technological advances in recent years. First, copper has replaced Aluminum as …
The importance of statistical analyses on 2D materials-based electronic devices and circuits is sometimes overlooked. Here the authors discuss the most pressing integration issues for …
We present an overview of various aspects of the self-assembly of organic monolayers on silicon substrates for molecular electronics applications. Different chemical strategies …
An overview is presented of the significant influences of Moore's Law scaling on radiation effects on microelectronics, focusing on historical trends and future needs. A number of …