The properties of ferroelectric films at small dimensions

TM Shaw, S Trolier-McKinstry… - Annual Review of …, 2000 - annualreviews.org
▪ Abstract This paper reviews the literature on size effects in ferroelectric materials, with an
emphasis on thin film perovskite ferroelectrics. The roles of boundary conditions, defect …

Barium strontium titanate thin film varactors for room-temperature microwave device applications

P Bao, TJ Jackson, X Wang… - Journal of physics D …, 2008 - iopscience.iop.org
Recent progress in the development of barium strontium titanate thin film varactors for room
temperature tunable microwave devices applications is reviewed, with emphasis on efforts …

Electrical characterization of thin Al2O3 films grown by atomic layer deposition on silicon and various metal substrates

MD Groner, JW Elam, FH Fabreguette, SM George - Thin solid films, 2002 - Elsevier
Al2O3 films with thicknesses ranging from 30 to 3540 Å were grown in a viscous flow reactor
using atomic layer deposition (ALD) with trimethylaluminum and water as the reactants …

[PDF][PDF] Enhanced charge carrier mobility in two-dimensional high dielectric molybdenum oxide

S Balendhran, J Deng, JZ Ou, S Walia, J Scott, J Tang… - Adv. Mater, 2013 - academia.edu
In atomically thin two-dimensional (2D) materials, free charges have quantized energy
levels in one spatial dimension, while they are mobile in the other two.[1] The interest in …

Origin of the dielectric dead layer in nanoscale capacitors

M Stengel, NA Spaldin - Nature, 2006 - nature.com
Capacitors are a mainstay of electronic integrated circuits and devices, where they perform
essential functions such as storing electrical charge, and blocking direct current while …

High-performance thin-film transistor with atomic layer deposition (ALD)-derived indium–gallium oxide channel for back-end-of-line compatible transistor applications …

JS Hur, MJ Kim, SH Yoon, H Choi… - … Applied Materials & …, 2022 - ACS Publications
In this paper, the feasibility of an indium–gallium oxide (In2 (1-x) Ga2 x O y) film through
combinatorial atomic layer deposition (ALD) as an alternative channel material for back-end …

Electroceramic materials

N Setter, R Waser - Acta materialia, 2000 - Elsevier
Electroceramics research is driven by technology and device applications. This growing field
includes a vast number of magnetic, dielectric, ionically conducting, semiconducting, and …

Al‐Doped TiO2 Films with Ultralow Leakage Currents for Next Generation DRAM Capacitors

SK Kim, GJ Choi, SY Lee, M Seo, SW Lee… - Advanced …, 2008 - Wiley Online Library
Dynamic random access memory (DRAM) is used as the main memory of every modern
computer, due to its high density, high speed and efficient memory function. Each DRAM cell …

The effect of flexoelectricity on the dielectric properties of inhomogeneously strained ferroelectric thin films

G Catalan, LJ Sinnamon, JM Gregg - Journal of Physics …, 2004 - iopscience.iop.org
Recent experimental measurements of large flexoelectric coefficients in ferroelectric
ceramics suggest that strain gradients can affect the polarization and permittivity behaviour …

Capacitors with an equivalent oxide thickness of< 0.5 nm for nanoscale electronic semiconductor memory

SK Kim, SW Lee, JH Han, B Lee, S Han… - Advanced Functional …, 2010 - Wiley Online Library
The recent progress in the metal‐insulator‐metal (MIM) capacitor technology is reviewed in
terms of the materials and processes mostly for dynamic random access memory (DRAM) …