Miniaturization as well as manufacturing processes that electronics devices are subjected to
often results in to increase in operational parameters such as current density, temperature …

Chip design with machine learning (ML) has been widely explored to achieve better
designs, lower runtime costs, and no human-in-the-loop process. However, with tons of …

Electromigration (EM) is a major failure effect for on-chip power grid networks of deep
submicron VLSI circuits. EM degradation of metal grid lines can lead to excessive voltage …

Abstract Graphene nanosheets (GNSs) modified Sn58Bi and Cu-core Sn58Bi solder joints
were manufactured in this work. The evolution of microstructure and growth of intermetallic …

A canonical form of the hydrostatic stress equations for electromigration is proposed to
determine the minimum number of parameters to calibrate the model. An efficient …

The advance of semiconductor technology not only enables integrated circuits with higher
density and better performance but also increases their vulnerability to various aging …

A physics-based system-level electromigration (EM) modelling platform is employed to
simulate EM and its impact on the IR drop from the supply voltage to the standard-cells for a …

In this work, we propose a novel physics-informed sparse regression (PISR) framework to
solve stress evolution (described by Korhonen's equations) in general multisegment wires …

Electromigration (EM) is crucial for interconnect reliability. This article introduces the
implementation and application of CacheEM which targets SRAM cache memory aging due …

Temperature gradient due to Joule heating has huge impacts on the electromigration (EM)
induced failure effects. However, Joule heating and related thermomigration (TM) effects …