MC Chiu, YH Lee, TM Chen - Journal of Industrial and Production …, 2022 - Taylor & Francis
Defect dies scattering on semiconductor wafer bin maps (WBM) tends to form specific patterns that point to particular manufacturing problems. The distribution of defect patterns …
This paper reviewed recent literature on inventory management technologies and Artificial Intelligence (AI) applications. The classical Artificial Neural Network (ANN) models and …
Warehouse management is a significant element of a supply chain. The warehouse's data accuracy is the foundation of the whole supply chain material flow, information flow, and …