Background: Electronic device scaling with the advancement of technology nodes maintains
the performance of the logic circuits with area benefit. Metal oxide semiconductor (MOS) …

Reliability of the electronic circuits is one of the most prominent factor in the development of
very large-scale integration (VLSI) industry. Huge demand for compact size and high …

Background: Scaling of the dimensions of semiconductor device plays a very important role
in the advancement of Very Large-Scale Integration (VLSI) technology. There are many …

新型工艺下芯片集成度的提高和尺寸的缩小导致了器件内部电场和电流密度的不断增加,
使得老化问题日趋严重, 当前针对老化主要的防护思路依然是采取保护带和预留时序裕量的方式 …

Supply voltage assignment (SVA) can alleviate the performance aging induced by the
negative bias temperature instability (NBTI) effect. However, due to the random …

As semiconductor processes advance, circuit aging becomes prominent. One of the most
severe aging effects is Negative Bias Temperature Instability (NBTI), which increases the …

The higher level of integration and smaller feature size in advanced technology nodes have
led to increased electrical field and current density, which worsen further the chip aging …