Advancements in mechanical characterization techniques and environmental effects on bi-material interfaces in microelectronics: a literature review

RA Ferreira, A Akhavan-Safar, RJC Carbas… - The Journal of …, 2025 - Taylor & Francis
Chip packaging engineering has evolved significantly to meet the performance demands of
integrated circuits (IC) and micro-electromechanical systems (MEMS). Layers, mainly …

Finite Element Simulation and Sensitivity Analysis of the Cohesive Parameters for Delamination Modeling in Power Electronics Packages

G Mirone, R Barbagallo, G Bua, G La Rosa - Materials, 2023 - mdpi.com
Delamination is a critical failure mode in power electronics packages that can significantly
impact their reliability and performance, due to the large amounts of electrical power …

Mode I Fatigue and Fracture Assessment of Polyimide–Epoxy and Silicon–Epoxy Interfaces in Chip-Package Components

P Morais, A Akhavan-Safar, RJC Carbas, EAS Marques… - Polymers, 2024 - mdpi.com
Semiconductor advancements demand greater integrated circuit density, structural
miniaturization, and complex material combinations, resulting in stress concentrations from …

[PDF][PDF] Impact Analysis of Microscopic Defect Types on the Macroscopic Crack Propagation in Sintered Silver Nanoparticles.

Z Zhang, B Wan, G Fu, Y Su, Z Wu… - … in Engineering & …, 2024 - cdn.techscience.cn
Sintered silver nanoparticles (AgNPs) are widely used in high-power electronics due to their
exceptional properties. However, the material reliability is significantly affected by various …

Cohesive Properties of Bimaterial Interfaces in Semiconductors: Experimental Study and Numerical Simulation Using an Inverse Cohesive Contact Approach

C Adler, P Morais, A Akhavan-Safar, RJC Carbas… - Materials, 2024 - mdpi.com
Examining crack propagation at the interface of bimaterial components under various
conditions is essential for improving the reliability of semiconductor designs. However, the …

Analytical stress analysis of the furan epoxy composite coatings subjected to tensile test

N Dolgov, P Stukhlyak, O Totosko… - Mechanics of …, 2024 - Taylor & Francis
The presence of reliable techniques for predicting the stress state in composite materials is
one of the most important requirements in the design of composite components and …

Epoxy-Printed Circuit Board Interfacial Fracture Reliability Under Three-Point and Four-Point Bend Loading After Sustained Elevated Temperature Exposure

P Lall, ARR Pandurangan… - Journal of …, 2024 - asmedigitalcollection.asme.org
The survivability and reliability of commercial electronic components under very high thermo-
mechanical loads are improved using underfilling and potting methods. Potting protects from …

[PDF][PDF] Static interface strength measurement in thin films: Mode I fracture delamination using double cantilever beam

P Morais, A Akhavan-Safar, EAS Marques, RJC Carbas… - fe.up.pt
Continuing demands in semiconductor industry demand increase in density of integrated
circuits (ICs) and complex material combinations. Mismatch in material properties like …