This paper presents a brief history of scanning probe microscopes (SPMs) and a general
insight into an atomic force microscope (AFM), including its operating principles, modes …

This paper addresses the control problem of adaptive backstepping control for a class of
nonlinear active suspension systems considering the model uncertainties and actuator input …

In this paper, we propose a new modeling and identification approach for piezoelectric-
actuated stages cascading hysteresis nonlinearity with linear dynamics, which is described …

In this paper, a proxy-based sliding-mode control (PBSMC) approach is proposed for robust
tracking control of a piezoelectric-actuated nanopositioning stage composed of piezoelectric …

This paper presents a method that combines a robust controller (H∞) and an iterative
learning controller (ILC) to control a low mechanical bandwidth nanopositioning stage for …

Nanotechnology is the branch of science which deals with the manipulation of matters at an
extremely high resolution down to the atomic level. In recent years, atomic force microscopy …

In most nanotechnology applications, speed and precision are important requirements for
obtaining good topographical maps of material surfaces using atomic force microscopes …

Piezoelectric hysteresis is a critical issue that significantly degrades the motion accuracy of
piezo-actuated nanopositioners. Such an issue is difficult to be precisely modeled and …

The scanning speed of atomic force microscopes (AFMs) is typically limited by the frequency
of the triangular trajectory used in generating the raster scan. This is because the higher …

As the road conditions are completely unknown in the design of a suspension controller, an
improved linear quadratic and Gaussian distributed (LQG) controller is proposed for active …