IoT devices need reliable hardware at low cost. It is challenging to efficiently cope with both
hard and soft faults in embedded scratchpad memories. To address this problem, we …

The reliability of memory subsystems is worsening rapidly and needs to be considered as
one of the primary design objectives when designing today's computer systems. From on …

Reducing the supply voltage in today′ s process technologies introduces significant
reliability challenges for on-chip SRAM arrays. As a reaction, many Cache Fault-Tolerance …

The aggressive reduction of the supply voltage, aiming for ultra-low power operation, affects
the reliability of ICs and especially the memory structures (SRAM cells). Furthermore, the …

The memory system presents many problems in computer architecture and system design.
An important challenge is worsening hardware variability that is caused by nanometer-scale …

Dynamic voltage and frequency scaling (DVFS) is a commonly-used power-management
technique. Unfortunately, voltage scaling increases the impact of process variations on …

As the technology continuous to shrink, power consumption appears to be the main design
parameter. Operation on low voltage negatively affects mainly the operation of on-chip …

Aggressive dynamic voltage and frequency scaling is widely used to reduce the power
consumption of microprocessors. Unfortunately, voltage scaling increases the impact of …

Operating below nominal voltage levels is a promising direction to enable ultra-low power
CMOS-based sytems. This is true due to the cubic relation between the dynamic power …

Voltage scaling increases the impact of process variations resulting in an exponential ramp-
up in the number of malfunctioning SRAM cells. Our experimental findings reveal that for …