The mechanical integrity of photovoltaic (PV) silicon wafers is critical to avoid failure during solar cell manufacturing. Residual stress present in wafers affects mechanical integrity …
M Stoehr, G Gerlach, T Härtling… - Journal of Sensors …, 2020 - jsss.copernicus.org
Photoelasticity is considered a useful measurement tool for the non-destructive and contactless determination of mechanical stresses or strains in the production of silicon …
RGR Prasath, K Skenes, S Danyluk - Journal of electronic materials, 2013 - Springer
This paper reports on a comparison of the six-and ten-step phase shifting methods in digital transmission photoelasticity and the application of these methods to obtain the residual …
We investigate the relationships between growth rate, time-temperature profile, residual stress, dislocation density, and electrical performance of silicon ribbons grown via optical …
K Skenes, A Kumar, RGR Prasath… - Journal of Electronic …, 2018 - Springer
Near-infrared (NIR) polariscopy is a technique used for the non-destructive evaluation of the in-plane stresses in photovoltaic silicon wafers. Accurate evaluation of these stresses …
CH Chen, HT Hu, FM Lin, HH Hsieh - J. Zhejiang Univ. A, 2017 - researchgate.net
The pressure to reduce solar energy costs encourages efforts to reduce the thickness of silicon wafers. Thus, the cell bowing problem associated with the use of thin wafers has …
M Fukuzawa, M Yamada - Materials science in semiconductor processing, 2006 - Elsevier
By using a scanning infrared polariscope (SIRP), the absolute difference of refractive index| Δn| and the principal direction ψ of strain-induced birefringence have been characterized in …
A Kumar, K Skenes, RGR Prasath, C Yang… - Proceedings of the …, 2013 - researchgate.net
Residual stresses are a major concern in thin silicon wafers because of their potentially detrimental effect on mechanical properties during cell processing. Residual stresses are …