Which concurrent error detection scheme to choose?

S Mitra, EJ McCluskey - … Test Conference 2000 (IEEE Cat. No …, 2000 - ieeexplore.ieee.org
Concurrent error detection (CED) techniques (based on hardware duplication, parity codes,
etc.) are widely used to enhance system dependability. All CED techniques introduce some …

[图书][B] Computer science handbook

AB Tucker - 2004 - taylorfrancis.com
When you think about how far and fast computer science has progressed in recent years, it's
not hard to conclude that a seven-year old handbook may fall a little short of the kind of …

[图书][B] System-on-chip test architectures: nanometer design for testability

LT Wang, CE Stroud, NA Touba - 2010 - books.google.com
Modern electronics testing has a legacy of more than 40 years. The introduction of new
technologies, especially nanometer technologies with 90nm or smaller geometry, has …

[PDF][PDF] Cost-effective approach for reducing soft error failure rate in logic circuits

K Mohanram, NA Touba - International Test Conference, 2003 …, 2003 - researchgate.net
In this paper, a new paradigm for designing logic circuits with concurrent error detection
(CED) is described. The key idea is to exploit the asymmetric soft error susceptibility of …

Sequential element design with built-in soft error resilience

M Zhang, S Mitra, TM Mak, N Seifert… - … Transactions on very …, 2007 - ieeexplore.ieee.org
This paper presents a built-in soft error resilience (BISER) technique for correcting radiation-
induced soft errors in latches and flip-flops. The presented error-correcting latch and flip-flop …

Weight-based codes and their application to concurrent error detection of multilevel circuits

D Das, NA Touba - … 17th IEEE VLSI Test Symposium (Cat. No …, 1999 - ieeexplore.ieee.org
This paper proposes a new class of codes termed" weight-based codes" where each output
bit is assigned a weight and the check bits represent the stem of the weights of the output …

Combinational logic soft error correction

S Mitra, M Zhang, S Waqas, N Seifert… - 2006 IEEE …, 2006 - ieeexplore.ieee.org
We present two techniques for correcting radiation-induced soft errors in combinational logic-
error correction using duplication, and error correction using time-shifted outputs. Simulation …

TPAD: Hardware Trojan prevention and detection for trusted integrated circuits

TF Wu, K Ganesan, YA Hu, HSP Wong… - … on Computer-Aided …, 2015 - ieeexplore.ieee.org
There are increasing concerns about possible malicious modifications of integrated circuits
(ICs) used in critical applications. Such attacks are often referred to as hardware Trojans …

Identification and quantification of abundant species from pyrosequences of 16S rRNA by consensus alignment

Y Ye - 2010 IEEE International Conference on Bioinformatics …, 2010 - ieeexplore.ieee.org
16S rRNA gene profiling has recently been boosted by the development of pyrosequencing
methods. A common analysis is to group pyrosequences into Operational Taxonomic Units …

Коды с суммированием для систем технического диагностирования

ВВ Сапожников, ВВ Сапожников, ДВ Ефанов - 2021 - elibrary.ru
В книге рассматриваются коды с суммированием, при построении которых
предварительно устанавливается неравноправие между разрядами информационных …