Atom probe tomography 2012

TF Kelly, DJ Larson - Annual review of materials research, 2012 - annualreviews.org
In the world of tomographic imaging, atom probe tomography (APT) occupies the high-
spatial-resolution end of the spectrum. It is highly complementary to electron tomography …

Green gap in GaN-based light-emitting diodes: in perspective

M Usman, M Munsif, U Mushtaq, AR Anwar… - Critical Reviews in …, 2021 - Taylor & Francis
Significant progress has been made in the advancement of light-emitting devices in both the
blue and the red parts of the emission spectrum. However, the quantum efficiency of green …

Efficiency Drop in Green Light Emitting Diodes: The Role of Random Alloy Fluctuations

M Auf der Maur, A Pecchia, G Penazzi, W Rodrigues… - Physical review …, 2016 - APS
White light emitting diodes (LEDs) based on III-nitride InGaN/GaN quantum wells currently
offer the highest overall efficiency for solid state lighting applications. Although current …

Atomistic analysis of the impact of alloy and well-width fluctuations on the electronic and optical properties of InGaN/GaN quantum wells

S Schulz, MA Caro, C Coughlan, EP O'Reilly - Physical Review B, 2015 - APS
We present an atomistic description of the electronic and optical properties of In 0.25 Ga
0.75 N/GaN quantum wells. Our analysis accounts for fluctuations of well width, local alloy …

Carrier localization mechanisms in InGaN/GaN quantum wells

D Watson-Parris, MJ Godfrey, P Dawson, RA Oliver… - Physical Review B …, 2011 - APS
Localization lengths of the electrons and holes in InGaN/GaN quantum wells have been
calculated using numerical solutions of the effective mass Schrödinger equation. We have …

The consequences of high injected carrier densities on carrier localization and efficiency droop in InGaN/GaN quantum well structures

S Hammersley, D Watson-Parris, P Dawson… - Journal of Applied …, 2012 - pubs.aip.org
There is a great deal of interest in the underlying causes of efficiency droop in InGaN/GaN
quantum well light emitting diodes, with several physical mechanisms being put forward to …

Increasing the reliability of solid state lighting systems via self-healing approaches: A review

U Lafont, H Van Zeijl, S Van Der Zwaag - Microelectronics Reliability, 2012 - Elsevier
Reliability issues in solid state lighting (SSL) devices based on light emitting diodes (LED) is
of major concern as it is a limiting factor to promote these optoelectronic devices for general …

Polar (,)/ Quantum Wells: Revisiting the Impact of Carrier Localization on the “Green Gap” Problem

DSP Tanner, P Dawson, MJ Kappers, RA Oliver… - Physical Review …, 2020 - APS
We present a detailed theoretical analysis of the electronic and optical properties of c-plane
In Ga N/Ga N quantum-well structures with In contents ranging from 5% to 25%. Special …

[HTML][HTML] Impact of carrier localization on recombination in InGaN quantum wells and the efficiency of nitride light-emitting diodes: Insights from theory and numerical …

CM Jones, CH Teng, Q Yan, PC Ku… - Applied Physics …, 2017 - pubs.aip.org
We examine the effect of carrier localization due to random alloy fluctuations on the radiative
and Auger recombination rates in InGaN quantum wells as a function of alloy composition …

[HTML][HTML] The nature of carrier localisation in polar and nonpolar InGaN/GaN quantum wells

P Dawson, S Schulz, RA Oliver, MJ Kappers… - Journal of Applied …, 2016 - pubs.aip.org
In this paper, we compare and contrast the experimental data and the theoretical predictions
of the low temperature optical properties of polar and nonpolar InGaN/GaN quantum well …