Test compaction and the associated test data compression are two key components of the
post-production test as they reduce test pattern counts, the resultant test data volume, test …

This article surveys test point (TP) architectures and test point insertion (TPI) methods for
increasing pseudo-random and logic built-in self-test (LBIST) fault coverage. We present a …

Logic built-in self-test (LBIST) is now increasingly used with on-chip test compression as a
complementary solution for in-system test, where high quality, low power, low silicon area …

This article analyzes and rationalizes the capabilities of inversion-based test points (TPs)
when implemented in lieu of control-0/1 TPs. With upward scaling of transistor density, delay …

As cars become increasingly computerized and their safety functions are evolving rapidly,
the number of complex safety-critical components deployed in advanced driver assistance …

Hardware Trojans (HT) are the most malicious components attacking modern integrated
circuits (ICs). Information leakage, incorrect functionality, and overheating are the major …

This study applies artificial neural networks (ANNs) to increase stuck-at and delay fault
coverage of logic built-in self-test (LBIST) through test point insertion (TPI). Increasing TPI …

As cars become increasingly computerized and their safety functions evolve rapidly, the
number of complex safety-critical components deployed in advanced driver assistance …

The occurrence of silent data corruption because of hardware defects in large scale data
centers points to the advantages of applying functional test sequences to detect hardware …

This article analyzes and rationalizes the capabilities of inversion test points (TPs) when
implemented in lieu of traditional test point architectures. With scaling transistor density …